category: Test, Measurement and Analytics

category: IoT, Security & Automotive

Using Smart Data To Boost Semiconductor Reliability
By Laura Peters - 10 Oct, 2023 - Comments: 0

The chip industry is looking to AI and data analytics to improve yield, operational efficiency, and reduce the overall cost of designing and manufacturing complex devices. In fact, SEMI estimates its members could capture more than $60B in revenues associated through smart data use and AI. Getting there, however, requires overcoming a number of persistent obstacles. Smart data utilization is... » read more

Optimizing Metal Film Measurement On IGBT And MOSFET Power Devices With Picosecond Ultrasonic Technology
By Johnny Dai - 10 Oct, 2023 - Comments: 0

By Johnny Dai with Cheolkyu Kim and Priya Mukundhan In recent years, power semiconductor applications have expanded from industrial and consumer electronics to renewable energy and electric vehicles. Looking to the future, the most promising power semiconductor devices will be insulated gate bipolar transistor (IGBT) and power metal oxide semiconductor field effect transistor (power MOSFET) ... » read more

Integration Challenges For ATE Data
By Gregory Haley - 10 Oct, 2023 - Comments: 0

Tighter integration of automatic test equipment (ATE) into semiconductor manufacturing, so that data from one process can be seamlessly leveraged by another, holds significant promise to boost manufacturing efficiency and yield. The challenge is selling this concept to fabs, packaging houses, and their customers. Data involving yield parameters, process variations, and intricate details abou... » read more

AI Testing AI: The Future Of 6G Test
By Marcus daSilva - 10 Oct, 2023 - Comments: 0

The impending arrival of 6G technology promises to revolutionize the way we connect and communicate. With expected data rates of up to 100 times faster than 5G, 6G is poised to enable unprecedented applications, from augmented reality (AR) and virtual reality (VR) to real-time remote surgery and autonomous vehicles with ubiquitous connectivity. A significant facet of 6G's potential lies in the ... » read more

Comparison Of State-Of-The-Art Models For Socket Pin Defect Detection
By Vijayakumar Thangamariappan - 10 Oct, 2023 - Comments: 0

This article is adapted from a presentation at TestConX, March 5-8, 2023, Mesa, AZ, by Vijayakumar Thangamariappan, Nidhi Agrawal, Jason Kim, Constantinos Xanthopoulos, Ira Leventhal, and Ken Butler, Advantest America Inc., and Joe Xiao, Essai, Advantest Group. Test sockets have a key role to play in the semiconductor test industry. A socket serves as the critical interface between a teste... » read more

Streamlining Failure Analysis Of Chips
By Anne Meixner - 10 Oct, 2023 - Comments: 1

Experts at the Table: Semiconductor Engineering sat down to discuss how increasing complexity in semiconductor and packaging technology is driving shifts in failure analysis methods, with Frank Chen, director of applications and product management at Bruker Nano Surfaces & Metrology; Mike McIntyre, director of product management in the Enterprise Business Unit at Onto Innovation; Kamran Hak... » read more

Importance Of Certifications In Automotive IP
By Pawini Mahajan - 10 Oct, 2023 - Comments: 0

The automotive industry is renowned for its unwavering commitment to enforcing strict standards for enabling safety, quality, reliability, and security. However, upholding stringent measures to ensure vehicle safety and reliability has led to the need for predictive maintenance i.e., using advanced monitoring and analytical techniques as a part of Silicon Lifecycle Management (SLM) to anticipat... » read more

Delivering Real-Time Analytics To Semiconductor Test
By Eli Roth - 10 Oct, 2023 - Comments: 0

As defined by Moore’s Law, the semiconductor field has been growing at a steady pace since the 1960s. Concurrent with this progression, semiconductors are becoming more complex, densely integrated, and expensive to produce. While such advancements pose new challenges to semiconductor manufacturing, we can extend Moore’s Law well into the future by reimagining the way we approach the semicon... » read more

Particle Filter Material Choice For Raman And FTIR Microscopy
By Inga Koehler - 10 Oct, 2023 - Comments: 0

The filter material to analyze particulate matter with Raman or FTIR microspectroscopy plays a vital role. Their simple task is to filter liquids to isolate solids onto filters – but as soon as you introduce spectroscopic methods, the requirements on the filter increase drastically. But let’s start at the beginning: Which filters are at our disposal, and how do we select the right one for... » read more

Using Deep Data Analytics To Enhance Reliability Testing The Fast Roadmap for Zero Defects
By proteanTecs - 10 Oct, 2023 - Comments: 0

proteanTecs and ELES have partnered together to enhance reliability testing with deep data analytics. This collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs. This innovative approach adds parametric measurements during the stress test in order to accurately and pre... » read more

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