category: Top Stories

category: IoT, Security & Automotive

Stronger, Better Bonding In Advanced Packaging
By Katherine Derbyshire - 21 Jan, 2021 - Comments: 1

System-in-package integrators are moving toward copper-to-copper direct bonding between die as the bond pitch goes down, making the solder used to connect devices in a heterogenous package less practical. In thermocompression bonding, protruding copper bumps bond to pads on the underlying substrate. In hybrid bonding, copper pads are inlaid in a dielectric, reducing the risk of oxidation. ... » read more

Hidden Costs In Faster, Low-Power AI Systems
By Ed Sperling - 20 Jan, 2021 - Comments: 1

Chipmakers are building orders of magnitude better performance and energy efficiency into smart devices, but to achieve those goals they also are making tradeoffs that will have far-reaching, long-lasting, and in some cases unknown impacts. Much of this activity is a direct result of pushing intelligence out to the edge, where it is needed to process, sort, and manage massive increases in da... » read more

Von Neumann Is Struggling
By Brian Bailey - 18 Jan, 2021 - Comments: 5

In an era dominated by machine learning, the von Neumann architecture is struggling to stay relevant. The world has changed from being control-centric to one that is data-centric, pushing processor architectures to evolve. Venture money is flooding into domain-specific architectures (DSA), but traditional processors also are evolving. For many markets, they continue to provide an effective s... » read more

Die-To-Die Stress Becomes A Major Issue
By Ann Mutschler - 14 Jan, 2021 - Comments: 2

Stress is becoming more critical to identify and plan for at advanced nodes and in advanced packages, where a simple mismatch can impact performance, power, and the reliability of a device throughout its projected lifetime. In the past, the chip, package, and board in a system generally were designed separately and connected through interfaces from the die to the package, and from the packag... » read more

More Data, More Memory-Scaling Problems
By Bryon Moyer - 14 Jan, 2021 - Comments: 0

Memories of all types are facing pressures as demands grow for greater capacity, lower cost, faster speeds, and lower power to handle the onslaught of new data being generated daily. Whether it's well-established memory types or novel approaches, continued work is required to keep scaling moving forward as our need for memory grows at an accelerating pace. “Data is the new economy of this ... » read more

Verification’s Inflection Point
By Brian Bailey - 14 Jan, 2021 - Comments: 0

Functional verification is nearing an inflection point, brought on by rising complexity and the many tentacles that are intermixing it with other disciplines. New abstractions or different ways to approach the problems are needed. Being a verification engineer is no longer enough, except for those whose concerns is block-level verification. Most of the time and effort spent in verification i... » read more

Hard-To-Hire Engineering Jobs
By Susan Rambo - 13 Jan, 2021 - Comments: 3

While the pandemic has hurt many job sectors, the semiconductor industry can't get enough qualified people. And that shortage is expected to persist for years, as companies reach deep into untapped talent pools around the globe. Most in demand are experienced engineers and engineers with hybrid knowledge. Skills in machine learning and artificial intelligence are very desirable. Combined kno... » read more

Too Much Fab And Test Data, Low Utilization
By Anne Meixner - 12 Jan, 2021 - Comments: 7

Can there be such a thing as too much data in the semiconductor and electronics manufacturing process? The answer is, it depends. An estimated 80% or more of the data collected across the semiconductor supply chain is never looked at, from design to manufacturing and out into the field. While this may be surprising, there are some good reasons: Engineers only look at data necessary to s... » read more

Testing Silicon Photonics In Production
By Bryon Moyer - 12 Jan, 2021 - Comments: 1

As silicon photonics costs come down, the technology is being worked into new applications, from connectivity to AI. But full commercial production requires testing those photonic circuits before shipping them. Photonics testing is only getting started. Volume production is still not happening, and test equipment and techniques are still being developed. What exists today is a blend of exist... » read more

Using Analytics To Reduce Burn-in
By Anne Meixner - 12 Jan, 2021 - Comments: 3

Silicon providers are using adaptive test flows to reduce burn-in costs, one of the many approaches aimed at stemming cost increases at advanced nodes and in advanced packages. No one likes it when their cell phone fails within the first month of ownership. But the problems are much more pressing when the key components in data warehouse servers or automobiles fail. Reliability expectations ... » read more

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