category: Top Stories

category: IoT, Security & Automotive

The Next Big Leap: Energy Optimization
By Brian Bailey - 16 Nov, 2020 - Comments: 1

The relationship between power and energy is technically simple, but its implication on the EDA flow is enormous. There are no tools or flows today that allow you to analyze, implement, and optimize a design for energy consumption, and getting to that point will require a paradigm shift within the semiconductor industry. The industry talks a lot about power, and power may have become a more ... » read more

Designs Beyond The Reticle Limit
By Brian Bailey - 12 Nov, 2020 - Comments: 0

Designs continue to grow in size and complexity, but today they are reaching both physical and economic challenges. These challenges are causing a reversal of the integration trend that has provided much of the performance and power gains over the past couple of decades. The industry, far from giving up, is exploring new ways to enable designs to go beyond the reticle size, which is around 8... » read more

Dealing With Sub-Threshold Variation
By Bryon Moyer - 12 Nov, 2020 - Comments: 0

Chipmakers are pushing into sub-threshold operation in an effort to prolong battery life and reduce energy costs, adding a whole new set of challenges for design teams. While process and environmental variation long have been concerns for advanced silicon process nodes, most designs operate in the standard “super-threshold” regime. Sub-threshold designs, in contrast, have unique variatio... » read more

Difficult Memory Choices In AI Systems
By Ann Mutschler - 12 Nov, 2020 - Comments: 0

The number of memory choices and architectures is exploding, driven by the rapid evolution in AI and machine learning chips being designed for a wide range of very different end markets and systems. Models for some of these systems can range in size from 10 billion to 100 billion parameters, and they can vary greatly from one chip or application to the next. Neural network training and infer... » read more

Challenges Linger For EUV
By Mark LaPedus - 11 Nov, 2020 - Comments: 2

Semiconductor Engineering sat down to discuss lithography and photomask issues with Bryan Kasprowicz, director of technology and strategy and a distinguished member of the technical staff at Photronics; Harry Levinson, principal at HJL Lithography; Noriaki Nakayamada, senior technologist at NuFlare; and Aki Fujimura, chief executive of D2S. What follows are excerpts of that conversation. To vie... » read more

Adaptive Test Gains Ground
By Anne Meixner - 10 Nov, 2020 - Comments: 0

Not all devices get tested the same way anymore, and that’s a good thing. Quality, test costs, and yield have motivated product engineers to adopt test processes that fall under the umbrella of adaptive test, which uses test data to modify a subsequent test process. But to execute such techniques requires logistics that support analysis of data, as well as enabling changes to a test based ... » read more

Does HW Vs. SW Choice Affect Quality And Reliability?
By Bryon Moyer - 10 Nov, 2020 - Comments: 0

Electronic systems comprise both hardware and software. Which functions are implemented with hardware and which with software are decisions made based upon a wide variety of considerations, including concerns about quality and reliability. Hardware may intrinsically provide for higher device quality, but it is also the source of reliability concerns. This is in contrast with popular views of... » read more

Chips Good Enough To Bet Your Life On
By Ed Sperling - 10 Nov, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss automotive electronics reliability with Jay Rathert, senior director of strategic collaborations at KLA; Dennis Ciplickas, vice president of advanced solutions at PDF Solutions; Uzi Baruch, vice president and general manager of the automotive business unit at OptimalPlus; Gal Carmel, general manager of proteanTecs' Automotive Division; Andre van de ... » read more

Dealing With Two Very Different Sides Of 5G
By Ed Sperling - 09 Nov, 2020 - Comments: 0

Semiconductor Engineering sat down to discuss 5G reliability with Anthony Lord, director of RF product marketing at FormFactor; Noam Brousard, system vice president at proteanTecs; Andre van de Geijn, business development manager at yieldHUB; and David Hall, head of semiconductor marketing at National Instruments. What follows are excerpts of that conversation. To view part one of this discussi... » read more

Growing Complexity Adds To Auto IC Safety Challenges
By Ann Mutschler - 05 Nov, 2020 - Comments: 0

The automotive industry is working to streamline, automate and tame verification of automotive electronic control units, SoCs and other chips used in vehicles, many of which are becoming so complex and intertwined that progress is getting bogged down. Modern cars may have up to 100 ECUs, which control such vehicle functions as engine, powertrain, transmission, brakes, suspension, entertainme... » read more

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