The Future Of Fault Coverage In Chips


Heterogeneous integration and sophisticated packaging are making chips more difficult to test, necessitating more versatile and efficient testing methods to minimize the time and cost it takes for each test insertion. In the past, test costs typically were limited to about 2% of the total cost of a chip. That cost has been rising in recent years, and with chiplets, advanced packaging, and mo... » read more

Doing More At Functional Test


Experts at the Table: Semiconductor Engineering sat down to discuss the increasing importance of functional test, especially in high-performance computing, with Klaus-Dieter Hilliges, V93000 platform extension manager at Advantest Europe; Robert Cavagnaro, fellow in the Design Engineering Group at Intel (responsible for manufacturing and test strategy of data center products); Nitza Basoco, tec... » read more

SRAM Security Concerns Grow


SRAM security concerns are intensifying as a combination of new and existing techniques allow hackers to tap into data for longer periods of time after a device is powered down. This is particularly alarming as the leading edge of design shifts from planar SoCs to heterogeneous systems in package, such as those used in AI or edge processing, where chiplets frequently have their own memory hi... » read more

Using AI/ML To Combat Cyberattacks


Machine learning is being used by hackers to find weaknesses in chips and systems, but it also is starting to be used to prevent breaches by pinpointing hardware and software design flaws. To make this work, machine learning (ML) must be trained to identify vulnerabilities, both in hardware and software. With proper training, ML can detect cyber threats and prevent them from accessing critic... » read more

Software-Defined Vehicle Momentum Grows


Experts at the Table: The automotive ecosystem is undergoing a transformation toward software-defined vehicles, spurring new architectures with more software. Semiconductor Engineering sat down to discuss the impact of these changes with Suraj Gajendra, vice president of products and solutions in Arm's automotive line of business; Chuck Alpert, R&D automotive fellow at Cadence; Steve Spadon... » read more

Communication Is Key To Finding And Fixing Bugs In ICs


Experts at the Table: Finding and eliminating bugs at the source can be painstaking work, but it also can prevent even greater problems from developing later on. To examine the best ways to tackle this problem, Semiconductor Engineering sat down with Ashish Darbari, CEO at Axiomise; Ziyad Hanna, corporate vice president R&D at Cadence; Jim Henson, ASIC verification software product manager ... » read more

Can Models Created With AI Be Trusted?


EDA models that are created using AI need to pass more stringent quality and cost benefit analysis compared to many AI applications in the broader industry. Money is hanging on the line if AI gets it wrong, and all the associated costs must be factored into the equation. Models are some of the most expensive things a development team can create, and it is important to understand the value th... » read more

Fundamental Issues In Computer Vision Still Unresolved


Given computer vision’s place as the cornerstone of an increasing number of applications from ADAS to medical diagnosis and robotics, it is critical that its weak points be mitigated, such as the ability to identify corner cases or if algorithms are trained on shallow datasets. While well-known bloopers are often the result of human decisions, there are also fundamental technical issues that ... » read more

Design Considerations In Photonics


Experts at the Table: Semiconductor Engineering sat down to talk about what CMOS and photonics engineers need to know to successfully collaborate, with James Pond, fellow at Ansys; Gilles Lamant, distinguished engineer at Cadence; and Mitch Heins, business development manager for photonic solutions at Synopsys. What follows are excerpts of that conversation. To view part one of this discussion,... » read more

Multi-Die Design Pushes Complexity To The Max


Multi-die/multi-chiplet design has thrown a wrench into the ability to manage design complexity, driving up costs per transistor, straining market windows, and sending the entire chip industry scrambling for new tools and methodologies. For multiple decades, the entire semiconductor design ecosystem — from EDA and IP providers to foundries and equipment makers — has evolved with the assu... » read more

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