category: Top Stories

category: IoT, Security & Automotive

Big Changes In Materials And Processes For IC Manufacturing
By Ed Sperling And Laura Peters - 21 Apr, 2022 - Comments: 3

Rama Puligadda, CTO at Brewer Science, sat down with Semiconductor Engineering to talk about a broad set of changes in semiconductor manufacturing, packaging, and materials, and how that will affect reliability, processes, and equipment across the supply chain. SE: What role do sacrificial materials play in semiconductor manufacturing, and how is that changing at new process nodes? Puliga... » read more

Hiding Security Keys Using ReRAM PUFs
By Katherine Derbyshire - 21 Apr, 2022 - Comments: 2

Resistive RAM and physically unclonable functions (PUFs) have been gaining traction for completely different reasons, but when combined they create an extremely secure and inexpensive way of storing authentication keys. As security concerns shift from purely software to a combination of hardware and software, chipmakers and systems companies have been scrambling to figure out how to prevent ... » read more

More Options, Less Dark Silicon
By Ed Sperling - 20 Apr, 2022 - Comments: 0

Chipmakers are beginning to re-examine how much dark silicon should be used in a heterogenous system, where it works best, and what alternatives are available — a direct result of a slowdown in Moore's Law scaling and the increasing disaggregation of SoCs. The concept of dark silicon has been around for a couple decades, but it really began taking off with the introduction of the Internet ... » read more

Energy Harvesting Starting To Gain Traction
By John Koon - 18 Apr, 2022 - Comments: 4

Tens of billions of IoT devices are powered by batteries today. Depending on the compute intensity and the battery chemistry, these devices can run steadily for short periods of time, or they can run occasionally for decades. But in some cases, they also can either harvest energy themselves, or tap into externally harvested energy, allowing them to work almost indefinitely. Energy harvesting... » read more

Always-On, Ultra-Low-Power Design Gains Traction
By Ann Mutschler - 14 Apr, 2022 - Comments: 0

A surge of electronic devices powered by batteries, combined with ever-increasing demand for more features, intelligence, and performance, is putting a premium on chip designs that require much lower power. This is especially true for always-on circuits, which are being added into AR/VR, automotive applications with over-the-air updates, security cameras, drones, and robotics. Also known as ... » read more

Architecting Faster Computers
By Brian Bailey - 14 Apr, 2022 - Comments: 3

To create faster computers, the industry must take a major step back and re-examine choices that were made half a century ago. One of the most likely approaches involves dropping demands for determinism, and this is being attempted in several different forms. Since the establishment of the von Neumann architecture for computers, small, incremental improvements have been made to architectures... » read more

Increasing Performance With Data Acceleration
By Martha DeGrasse - 14 Apr, 2022 - Comments: 0

Increasing demand for functions that require a relatively high level of acceleration per unit of data is providing a foothold for in-line accelerator cards, which could mean new opportunities for some vendors and a potential threat for others. For years, either CPUs, or CPUs with FPGA accelerators, met most market needs. But the rapid increase in the volume of data everywhere, coupled with t... » read more

Strategies For Faster Yield Ramps On 5nm Chips
By Laura Peters - 12 Apr, 2022 - Comments: 0

Leading chipmakers TSMC and Samsung are producing 5nm devices in high volume production and TSMC is forging ahead with plans for first 3nm silicon by year end. But to meet such aggressive targets, engineers must identify defects and ramp yield faster than before. Getting a handle on EUV stochastic defects — non-repeating patterning defects such as microbridges, broken lines, or missing con... » read more

Finding And Applying Domain Expertise In IC Analytics
By Anne Meixner - 12 Apr, 2022 - Comments: 0

Behind PowerPoint slides depicting the data inputs and outputs of a data analytics platform belies the complexity, effort, and expertise that improve fab yield. With the tsunami of data collected for semiconductor devices, fabs need engineers with domain expertise to effectively manage the data and to correctly learn from the data. Naively analyzing a data set can lead to an uninteresting an... » read more

Silicon Lifecycle Management’s Growing Impact On IC Reliability
By Ed Sperling - 12 Apr, 2022 - Comments: 0

Experts at the Table: Semiconductor Engineering sat down to talk about silicon lifecycle management, how it's expanding and changing, and where the problems are, with Prashant Goteti, principal engineer at Intel; Rob Aitken, R&D fellow at Arm; Zoe Conroy, principal hardware engineer at Cisco; Subhasish Mitra, professor of electrical engineering and computer science at Stanford University; a... » read more

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