Reliability Costs Becoming Harder To Track


Ensuring reliability in chips is becoming more complex and significantly more expensive, shifting left into the design cycle and right into the field. But those costs also are becoming more difficult to define and track, varying greatly from one design to the next based upon process node, package technology, market segment, and which fab or OSAT is used. As the number of options increases fo... » read more

Is There a Practical Test For Rowhammer Vulnerability?


Rowhammer is proving to be a difficult DRAM issue to fix. While efforts continue to mitigate or eliminate the effect, no solid solution has yet made it to volume production. In addition, more aggressive process nodes are expected to exacerbate the problem. In the absence of a fix, then, testing may be one way to give DRAM manufacturers and users some way to segregate devices that are more su... » read more

Digging Much Deeper With Unit Retest


Keeping test costs flat in the face of product complexity continues to challenge both product and test engineers. Increased data collection at package-level test and the ability to respond to it in a never-before level of detail has prompted device makers and assembly and test houses to tighten up their retest processes. Test metrology, socket contamination, and mechanical alignment have alw... » read more

Big Changes Ahead For Connected Vehicles


Carmakers are reworking their electronic architectures so they can tap into a growing number of external services and internal options, similar to the way a data center taps into various services over its internal network. In the past, this has been largely confined to internal services such as on-board Internet connectivity, and external traffic routing and music. The current vision is to g... » read more

The Case For FPGAs In Cars


Field-programmable gate arrays (FPGAs) thrive in rapidly evolving new markets before being replaced by hard-wired ASICs, but in automotive that crossover is likely to happen significantly later than in the past. Historically, FPGAs have held temporary positions until volumes increased enough to cost-reduce the FPGAs out in favor of a hardened version. With automobiles, there are so many chan... » read more

The Good And Bad Of Auto IC Updates


Keeping automobiles updated enough to avoid problems is becoming increasingly difficult as more complex electronics are added into vehicles, and as the lifetimes of those devices are extended to a decade or more. Modern vehicles are full of electronics. In fact, the value of electronic devices used in modern vehicles is expected to double in the next 10 years, growing to $469 billion by 2030... » read more

Startup Funding: May 2021


Big investment poured into AI hardware companies this month, with a focus on edge applications. Companies are experimenting with different architectures, including analog-focused devices and those that are capable of withstanding the harsh conditions of space. IP and EDA startups in China also drew funding as the country tries to create a full chip design ecosystem. Plus, PCB assembly, photonic... » read more

Continuing Challenges For Open-Source Verification


Experts at the Table: This is the last part of the series of articles derived from the DVCon panel that discussed Verification in the Era of Open Source. It takes the discussion beyond what happened in the panel and utilizes some of the questions that were posed, but never presented to the panelists due to lack of time. Contributing to the discussion are Ashish Darbari, CEO of Axiomise; Serge L... » read more

Do We Have An IC Model Crisis?


Models are critical for IC design. Without them, it's impossible to perform analysis, which in turn limits optimizations. Those optimizations are especially important as semiconductors become more heterogenous, more customized, and as they are integrated into larger systems, creating a need for higher-accuracy models that require massive compute power to develop. But those factors, and other... » read more

Pushing The Limits Of Hardware-Assisted Verification


As semiconductor complexity continues to escalate, so does the reliance on hardware-assisted simulation, emulation, and prototyping. Since chip design first began, engineers have complained their design goals exceeded the capabilities of the tools. This is especially evident in verification and debug, which continue to dominate the design cycle. Big-iron tooling has enabled design teams to k... » read more

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