Integration Challenges For RISC-V Designs


One of the big draws of RISC-V is that it allows design teams to create unique chips or chiplets and to make modifications to the instruction-set architecture. That extra degree of freedom also creates some issues when it comes to integrating those designs into packages or systems because they may require non-standard connectivity approaches. Frank Schirrmeister, vice president of marketing at ... » read more

Densification Of RF Designs


It’s challenging enough to deal with wireless signals at the 5G and 6G frequencies. But with increased density in chips crammed into smaller packages, higher power, beam forming, and MIMO, design requirements are very different than in the past. Simple parasitic extraction no longer is sufficient. Daren McClearnon, product manager for RF and microwave simulation at Keysight, talks about the n... » read more

Improving AI Productivity With AI


AI is showing up or proposed for nearly all aspects of chip design, but it also can be used to improve the performance of AI chips and to make engineers more productive earlier in the design process. Matt Graham, product management group director at Cadence, talks with Semiconductor Engineering about the role of AI in identifying patterns that are too complex for the human brain to grasp, how t... » read more

What To Do About Electrostatic Discharge


Electrostatic discharge is a well-understood phenomenon, but it’s becoming more difficult to plan for as single chips are replaced by multiple chips or chiplets in a package, and as the density of components continues to increase with each new node. In both cases, the probability for failure increases unless these sudden shocks are addressed in the design. Dermott Lynch, director of product m... » read more

Coding And Debugging RISC-V


As monolithic device scaling continues to wind down and evolve toward increasingly heterogeneous designs, it has created an inflection point for chip architects to create customized cores that are much more energy efficient and faster than off-the-shelf processors. Zdeněk Přikryl, CTO of Codasip, talks about where RISC-V fits into this picture, using a modular ISA and custom instruction layer... » read more

DSP Techniques For High-Speed SerDes


Sensors everywhere, more connected devices, and the rollout of smart everything has created a flood of data. The question now is how to best handle all of that data, where to process it, and how to move it locally and to the outside network. Madhumita Sanyal, technical product manager at Synopsys, talks about the need for continuous performance improvements in SerDes, PCIe, NRZ, and PAM4, and w... » read more

Memory And High-Speed Digital Design


As DRAM gets faster, timing constraints, jitter, and signal integrity become harder to control. The real challenge is to understand what can go wrong early in the design process, and that becomes more complex with each new version of memory and higher signal speeds. Stephen Slater, product manager for EDA products at Keysight, talks about how simulation can be applied to these issues, what to t... » read more

Verifying A RISC-V Processor


Verifying an SoC is very different than verifying a processor due to the huge state space in the processor. In addition to the tools needed for an SoC, additional tools are required for a step and compare environment. Larry Lapides, vice president at Imperas, talks about the need to verify asynchronous events like interrupts, how to compare a reference model to RTL, and the need for both hardwa... » read more

Application-Optimized Processors


Executing a neural network on top of an NPU requires an understanding of application requirements, such as latency and throughput, as well as the potential partitioning challenges. Sharad Chole, chief scientist and co-founder of Expedera, talks about fine-grained dependencies, why processing packets out of order can help optimize performance and power, and when to use voltage and frequency scal... » read more

Challenges In Ramping New Manufacturing Processes


Despite a slowdown for Moore’s Law, there are more new manufacturing processes rolling out faster than ever before. The challenge now is to decrease time to yield, which involves everything from TCAD and design technology co-optimization, to refinement of power, performance, area/cost, and process control and analytics. Srinivas Raghvendra, vice president of engineering at Synopsys, talks abo... » read more

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