MTJ-CRAM; photonics fabrication; energy-efficient PIM processors; reducing of dynamic IR drop; mitigating Rowhammer; attacks on 3DIC; semiconductor defect inspection.
New technical papers recently added to Semiconductor Engineering’s library:
| Technical Paper | Research Organizations |
|---|---|
| Mechanically-flexible wafer-scale integrated-photonics fabrication platform | MIT and NY CREATES |
| Experimental demonstration of magnetic tunnel junction-based computational random-access memory | University of Minnesota and University of Arizona, Tucson |
| Survey of Deep Learning Accelerators for Edge and Emerging Computing | University of Dayton and the Air Force Research Laboratory |
| A Hybrid ECO Detailed Placement Flow for Improved Reduction of Dynamic IR Drop | UC San Diego |
| MINT: Securely Mitigating Rowhammer with a Minimalist In-DRAM Tracker | Georgia Tech, Google, and Nvidia |
| Harnessing Heterogeneity for Targeted Attacks on 3DICs | Drexel University |
| An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection | Imec and SCREEN SPE Germany |
More Reading
Technical Paper Library home
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