How to minimize design margins with accurate advanced transistor degradation models.
Reliability is a major criterion for integrated circuits (ICs) in safety critical applications, such as automotive, medical, or aviation electronics. A particular effect that contributes to wear-out is device (i.e. transistor) degradation. Its impact on the circuit behavior can be verified by circuit level aging simulations, which are offered by various EDA vendors. However, reasonable results can only be achieved with accurate and efficient device (i.e. transistor) degradation models. This white paper discusses the state of the art and points out opportunities for improvements.
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Slowdown due to impact on timing, and dependencies between power, thermal and timing that may not be caught by signoff tools.
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Interest in the open-source ISA marks a significant shift among chipmakers, but it will require continued industry support to be successful.
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Slowdown due to impact on timing, and dependencies between power, thermal and timing that may not be caught by signoff tools.
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Shift to cloud model has kept power consumption in check, but that benefit may have run its course.
Old solutions don’t necessarily work anymore, particularly at advanced nodes and ultra-low voltage.
Edge compute covers a wide range of applications. Understanding bandwidth and capacity needs is critical.
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