Chip Aging Accelerates


Reliability is becoming an increasingly important proof point for new chips as they are rolled out in new markets such as automotive, cloud computing and industrial IoT, but actually proving that a chip will function as expected over time is becoming much more difficult. In the past, reliability generally was considered a foundry issue. Chips developed for computers and phones were designed ... » read more

Circuit-Level Aging Simulations Predict The Long-Term Behavior Of ICs


Reliability is a major criterion for integrated circuits (ICs) in safety critical applications, such as automotive, medical, or aviation electronics. A particular effect that contributes to wear-out is device (i.e. transistor) degradation. Its impact on the circuit behavior can be verified by circuit level aging simulations, which are offered by various EDA vendors. However, reasonable results ... » read more

Tech Talk: Substrate Noise Coupling


Roland Jancke, head of the department for design methodology for the Fraunhofer's Engineering of Adaptive Systems Division, talks with Semiconductor Engineering about the impact of substrate noise coupling on reliability of chips and how to deal with this issue. https://youtu.be/7E2rCwYr6-o » read more