tag: transistor aging

The Vulnerability of Clock Trees to Asymmetric Aging
By Technical Paper Link - 03 Dec, 2024 - Comments: 0

A new technical paper titled "The Impact of Asymmetric Transistor Aging on Clock Tree Design Considerations" was published by researchers at Israel Institute of Technology and The Hebrew University of Jerusalem. Abstract "Ensuring integrated circuits (ICs) operate reliably throughout their expected service life is more vital than ever, particularly as they become increasingly central to mis... » read more

Aging Analysis Standard Solidifies Through Collaborative Effort
By Ahmed Ramadan - 12 Mar, 2020 - Comments: 0

By Ahmed Ramadan, Greg Curtis, Harrison Lee, Jongwook Kye, and Sorin Dobre We live in a connected world and it is estimated that by 20251 the total amount of worldwide data will swell to 163 ZB, or 163 trillion gigabytes. This rapid growth in data expansion is driving an explosion in new designs and new requirements for consumer, data center, automotive, and Internet of Things (IoT) applicat... » read more

Process Variation And Aging
By Ann Mutschler - 17 Jan, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; and Naseer Khan, vice president of sales at M... » read more

Aging Analysis Hits Mainstream
By Ann Mutschler - 08 Nov, 2018 - Comments: 1

Given the ever increasing challenge of designing high-reliability ICs – especially for automotive, medical, industrial, and aerospace and defense applications – the inclusion of aging analysis capabilities is on the rise in EDA tools as well as design IP. The issue comes down to predictability of devices as they operate. As discussed in, “Taming NBTI To Improve Device Reliability,” t... » read more

Data Converters For Automotive Applications
By Manuel Mota - 04 Oct, 2018 - Comments: 0

Sensor applications requiring data converters range from temperature sensors identifying different engine status to radar/LIDAR enabling Automotive Driver Assistance Systems (ADAS). Other applications involving data converters include wireless transceivers for communicating with other vehicles or with a fixed network. The data converter IP (analog-to-digital and digital-to-analog) provides an i... » read more

Aging In Advanced Nodes
By Ann Mutschler - 17 Sep, 2018 - Comments: 0

Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; Magdy Abadir, vice president of marketing at ... » read more

Tech Talk: ISO 26262 Drilldown
By Ed Sperling - 06 Jun, 2018 - Comments: 0

ArterisIP’s Kurt Shuler looks at what can go wrong in automotive design, what are the prerequisites for getting the attention of Tier 1 and OEMs, and what’s involved in automotive design at all levels. https://youtu.be/nnjAldn-nKU » read more

Aging Models: The Basis For Predicting Circuit Reliability
By Andre Lange - 12 Apr, 2018 - Comments: 0

Today, many products are based on high-performance electronic systems and integrated circuits (ICs), and the importance of these elements is ever-increasing. A certain tension arises here as these applications often call for a large amount of processing power and reliability. The processing power can best be supplied with highly scaled semiconductor technologies. However, these manufacturing te... » read more

Thermal Issues And Modern SoCs: How Hot Is Hot?
By Ramsay Allen - 16 Mar, 2018 - Comments: 0

A Q&A with Moortec CTO Oliver King. What are the thermal issues of modern SoCs? Gate density has been increasing with each node and that pushes up power per unit area, and I think that has become an even bigger issue with FinFET processes where the channels are more thermally isolated than the planar processes before them. In the last few planar nodes, leakage was an issue which led ... » read more

Understanding Your Chip’s Age
By Ramsay Allen - 08 Feb, 2018 - Comments: 1

A Q&A with Moortec CTO Oliver King. Why is understanding your chip's age important? Semiconductor devices age over time, we all know that, but what is often not well understood are the mechanisms for aging or the limits that will cause a chip to fail. In addition, there is bound to be a requirement for a minimum lifetime of a device which will depend on application but could be two or... » read more

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