Process Variation And Aging


Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; and Naseer Khan, vice president of sales at M... » read more

Aging Analysis Hits Mainstream


Given the ever increasing challenge of designing high-reliability ICs – especially for automotive, medical, industrial, and aerospace and defense applications – the inclusion of aging analysis capabilities is on the rise in EDA tools as well as design IP. The issue comes down to predictability of devices as they operate. As discussed in, “Taming NBTI To Improve Device Reliability,” t... » read more

Data Converters For Automotive Applications


Sensor applications requiring data converters range from temperature sensors identifying different engine status to radar/LIDAR enabling Automotive Driver Assistance Systems (ADAS). Other applications involving data converters include wireless transceivers for communicating with other vehicles or with a fixed network. The data converter IP (analog-to-digital and digital-to-analog) provides an i... » read more

Aging In Advanced Nodes


Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; Magdy Abadir, vice president of marketing at ... » read more

Tech Talk: ISO 26262 Drilldown


ArterisIP’s Kurt Shuler looks at what can go wrong in automotive design, what are the prerequisites for getting the attention of Tier 1 and OEMs, and what’s involved in automotive design at all levels. https://youtu.be/nnjAldn-nKU » read more

Aging Models: The Basis For Predicting Circuit Reliability


Today, many products are based on high-performance electronic systems and integrated circuits (ICs), and the importance of these elements is ever-increasing. A certain tension arises here as these applications often call for a large amount of processing power and reliability. The processing power can best be supplied with highly scaled semiconductor technologies. However, these manufacturing te... » read more

Thermal Issues And Modern SoCs: How Hot Is Hot?


A Q&A with Moortec CTO Oliver King. What are the thermal issues of modern SoCs? Gate density has been increasing with each node and that pushes up power per unit area, and I think that has become an even bigger issue with FinFET processes where the channels are more thermally isolated than the planar processes before them. In the last few planar nodes, leakage was an issue which led ... » read more

Understanding Your Chip’s Age


A Q&A with Moortec CTO Oliver King. Why is understanding your chip's age important? Semiconductor devices age over time, we all know that, but what is often not well understood are the mechanisms for aging or the limits that will cause a chip to fail. In addition, there is bound to be a requirement for a minimum lifetime of a device which will depend on application but could be two or... » read more

Electronic Design For Reliable Autonomous Driving


In the area of advanced driver assistance systems, most car makers and their suppliers have laid out exciting road maps all the way to highly automated and fully automated driving in 5 to 10 years. But are the electronics keeping up with these ambitious plans? At least for the automotive industry as a mass market, the current design processes for microchips and systems are not yet ready. An ... » read more

Circuit-Level Aging Simulations Predict The Long-Term Behavior Of ICs


Reliability is a major criterion for integrated circuits (ICs) in safety critical applications, such as automotive, medical, or aviation electronics. A particular effect that contributes to wear-out is device (i.e. transistor) degradation. Its impact on the circuit behavior can be verified by circuit level aging simulations, which are offered by various EDA vendors. However, reasonable results ... » read more

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