A technical paper titled “Diamond p-Type Lateral Schottky Barrier Diodes With High Breakdown Voltage (4612 V at 0.01 mA/Mm)” was published by researchers at University of Illinois at Urbana–Champaign.
Abstract
“Diamond p-type lateral Schottky barrier diodes (SBDs) with a 2- μm -thick drift layer are fabricated with and without Al2O3 field plates. Schottky contacts composed of Mo (50 nm) / Pt (50 nm) / Au (100 nm) showed a barrier height of 1.02 ± 0.01 eV and ohmic contacts of Ti (30 nm) / Pt (30 nm) / Au (100 nm) achieved a specific ohmic contact resistance of 1.25 ±0.98×10-4 Ω -cm2. Their forward and reverse bias characteristics are studied in detail. Both SBDs, with and without Al2O3 field plates, exhibit rectifying ratios larger than 107 at room temperature, and a peak current density of 5.39 mA/mm under 40 V forward bias at 200 °C. The leakage current density at room temperature is stable at approximately 0.01 mA/mm for both diodes. The SBD without the Al2O3 field plate exhibited a breakdown voltage of 1159 V, while the SBD with the Al2O3 field plate is stable under a reverse voltage of 4612 V, which is higher than many diamond SBDs previously reported.”
Find the technical paper here. Published August 2023.
Z. Han and C. Bayram, “Diamond p-Type Lateral Schottky Barrier Diodes With High Breakdown Voltage (4612 V at 0.01 mA/Mm),” in IEEE Electron Device Letters, vol. 44, no. 10, pp. 1692-1695, Oct. 2023, doi: 10.1109/LED.2023.3310910.
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