tag: current density

Diamond Semiconductor: Highest Breakdown Voltage, Lowest Leakage Current
By Technical Paper Link - 29 Nov, 2023 - Comments: 0

A technical paper titled "Diamond p-Type Lateral Schottky Barrier Diodes With High Breakdown Voltage (4612 V at 0.01 mA/Mm)" was published by researchers at University of Illinois at Urbana–Champaign. Abstract "Diamond p-type lateral Schottky barrier diodes (SBDs) with a 2- μm -thick drift layer are fabricated with and without Al2O3 field plates. Schottky contacts composed of Mo (50 nm) ... » read more

ESD P2P And CD Verification Doesn’t Have To Be Hard
By Abdellah Bakhali - 24 Nov, 2020 - Comments: 0

As a designer or verification engineer, you’re fighting the effects of electrostatic discharge (ESD) in your integrated circuit (IC) designs all the time. ESD is one of those frustrating issues that can challenge even the most experienced designers. Once an IC is in the market, unexpected electrical shorts will cause immediate failure or dielectric breakdown will result in gradual circuit deg... » read more

Tech Talk: 5/3nm Parasitics
By Ed Sperling - 22 Feb, 2018 - Comments: 0

Ralph Iverson, principal R&D engineer at Synopsys, talks about parasitic extraction at 5/3nm and what to expect with new materials and gate structures such as gate-all-around FETs and vertical nanowire FETs. https://youtu.be/24C6byQBkuI » read more

Power Challenges At 10nm And Below
By Ann Mutschler - 11 May, 2017 - Comments: 1

Current density is becoming much more problematic at 10nm and beyond, increasing the amount of power management that needs to be incorporated into each chip and boosting both design costs and time to market. Current per unit of area has been rising since 90nm, forcing design teams to leverage a number of power-related strategies such as [getkc id="143" kc_name="dynamic voltage and frequency... » read more

IC Validator Programmable EERC Mixed Mode Checking Technology
By Synopsys - 26 Apr, 2017 - Comments: 0

Traditional visual inspection or manual checking for electrical rule compliance is both time consuming and error prone. A new, comprehensive reliability solution is needed to reduce time to market, improve reliability and ensure longer device operation. This paper is a companion to the introductory IC Validator programmable Extended Electrical Rule Check (EERC) white paper on netlist domain che... » read more

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