Next-Generation Parasitic Extraction For 16nm And Beyond

The Calibre xACT platform targets finFET, custom, analog and RF designs at 16nm and below.

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Advanced nodes and innovative process features such as finFET transistors require a leap forward in the performance and accuracy of analysis tools. The new Calibre xACT solution is a high-performance, high-accuracy parasitic extraction tool architected from the top-down for diverse IC design styles at advanced nodes. The Calibre xACT product delivers reference-level accuracy for leading-edge finFET, custom, analog and RF designs, while delivering the performance and capacity needed for multi-million instance digital designs. The Calibre xACT platform allows designers to meet a wide variety of extraction needs with signoff confidence in a single, familiar environment with outstanding turnaround time.

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