Next-Generation Parasitic Extraction For 16nm And Beyond

The Calibre xACT platform targets finFET, custom, analog and RF designs at 16nm and below.


Advanced nodes and innovative process features such as finFET transistors require a leap forward in the performance and accuracy of analysis tools. The new Calibre xACT solution is a high-performance, high-accuracy parasitic extraction tool architected from the top-down for diverse IC design styles at advanced nodes. The Calibre xACT product delivers reference-level accuracy for leading-edge finFET, custom, analog and RF designs, while delivering the performance and capacity needed for multi-million instance digital designs. The Calibre xACT platform allows designers to meet a wide variety of extraction needs with signoff confidence in a single, familiar environment with outstanding turnaround time.

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