Is Common Resistance Affecting Your Analog Design Reliability And Performance?


Integrated circuit (IC) design reliability has always been important and essential to market success. After all, if no one could count on your product to operate as designed, and for as long as intended, there wouldn’t be many buyers! However, given the increase in the types and complexity of design applications, coupled with the increasing technological challenge of manufacturing at advance... » read more

Parasitic Extraction of MIM/MOM Capacitors In Analog/RF Designs


The extensive use of MIM/MOM capacitors in analog/RF designs presents designers with extraction challenges that typically require multiple extraction techniques. The Calibre xACT platform offers analog/RF designers the fast performance of a rule-based extraction engine, and the capacity and performance of a field solver, to efficiently extract all parasitic components in a timely manner, with t... » read more

New Parasitic Extraction Requirements In Custom Design For The Next Wave Of SoCs


Fast growing markets like 5G, biotechnology, AI, and automotive are driving the new wave in semiconductor design and the need for highly integrated system on chip (SoCs). Power management, sensors, RF and precision analog functionality are all integrated on the same substrate which poses new challenges for custom design tools. Specifically, there are new challenges for parasitic extraction that... » read more

Top Tech Talks Of 2018


2018 shaped up to be a year of transition and inflection, sometimes in the same design. There were new opportunities in automotive, continued difficulties in scaling, and an explosion in AI and machine learning everywhere. Traffic numbers on stories give a snapshot of the most current trends, but with videos those trends are even more apparent because of the time invested in watching those v... » read more

Five Rules For Correlating Rule-based And Field Solver Parasitic Extraction Results


There comes a time at every foundry and IC design company when it becomes necessary to run a correlation between a rule-based parasitic extraction (PEX) table and a field solver solution. And when that time arrives, there are a few (five, to be precise) details that will help ensure the correlation produces accurate results. But before we get to those, let’s do a quick refresh on PEX techniqu... » read more

The Process Design Kit: Protecting Design Know-How


Once upon a time, integrated circuits (ICs) were built by the same companies that designed them. The design of an IC was tightly integrated with the manufacturing processes available within each company. In these days, when designs contained hundreds of transistors, companies modeled each feature in an IC at a first principles level, meaning each transistor or fundamental device was analyzed an... » read more

3D Extraction Necessities For 5nm And Below


For most of my career in product marketing I’ve been focused on Static Timing Analysis (STA). It was, and still is, an area with a diverse set of topics including graph based analysis and path based analysis, on-chip variation modeling, delay calculation, evolving library models, etc. During those years I always understood that  parasitic extraction was a crucial element of STA and more impo... » read more

Massively Parallel Electrically Aware Design


In-design verification is opening new opportunities to shorten design cycles and maximize circuit performance. Whereas physical verification has traditionally required a tradeoff between accuracy and performance for larger designs, recent advances in large-scale distributed computing may offer an alternative. Cloud infrastructure needs are pushing the industry toward larger multi-core server ar... » read more

Calibre xACT Parasitic Extraction Supports Signal Integrity At Advanced Nodes


At advanced nodes, signal integrity analysis requires precise characterization, which in turn requires an accurate extracted netlist. Models that handle new impacts on parasitic extraction at advanced nodes, including multi-patterning, finFETs, and resistance and capacitance effects, must be used. Learn how the Calibre xACT extraction tool supports these advanced foundry device models and leadi... » read more

Next-Generation Parasitic Extraction For 16nm And Beyond


Advanced nodes and innovative process features such as finFET transistors require a leap forward in the performance and accuracy of analysis tools. The new Calibre xACT solution is a high-performance, high-accuracy parasitic extraction tool architected from the top-down for diverse IC design styles at advanced nodes. The Calibre xACT product delivers reference-level accuracy for leading-edge fi... » read more

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