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Radiation-Hardened Non-Volatile Magnetic Latch That Tolerates SNUs and DNUs

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A research paper titled “A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage” was published by researchers at Anhui University, Hefei University of Technology, LIRMM, and Kyutech.

According to the abstract:
“Based on an advanced triple-path dual-interlocked-storage-cell (TPDICE) and MTJs, this paper proposes a radiation-hardened non-volatile magnetic latch, namely M-TPDICE, that can completely tolerate single-node upsets (SNUs) and double-node upsets (DNUs). Simulations of the proposed latch with the HSPICE tool with a 45 nm CMOS technology model have demonstrated the effectiveness of the proposed latch.”

Find the technical paper here. September 2022.

Citation: Aibin Yan, Liang Ding, Zhen Zhou, Zhengfeng Huang, Jie Cui, et al.. A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage. ATS 2022 – 29th IEEE Asian Test Symposium, Nov 2022, Taichung, Taiwan. In press. ⟨lirmm-03770951⟩.



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