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A Compact Model For Scalable MTJ Simulation


Read the full technical paper. Published June 9, 2021. Abstract This paper presents a physics-based modeling framework for the analysis and transient simulation of circuits containing Spin-Transfer Torque (STT) Magnetic Tunnel Junction (MTJ) devices. The framework provides the tools to analyze the stochastic behavior of MTJs and to generate Verilog-A compact models for their simulation in lar... » read more

Power/Performance Bits: May 10


Probabilistic bit Researchers at Tohoku University are working on building probabilistic computers by developing a spintronics-based probabilistic bit (p-bit). The researchers utilized magnetic tunnel junctions (MTJs). Most commonly used in MRAM technology, where thermal fluctuation typically poses a threat to the stable storage of information, in this case it was a benefit. The p-bits f... » read more

MRAM Evolves In Multiple Directions


Magnetoresistive RAM (MRAM) is one of several new non-volatile memory technologies targeting broad commercial availability, but designing MRAM into chips and systems isn't as simple as adding other types of memory. MRAM isn’t an all-things-for-all-applications technology. It needs to be tuned for its intended purpose. MRAMs targeting flash will not do as well targeting SRAMs, and vice vers... » read more

Testing Embedded MRAM IP For SoCs


The challenges of embedded memory test and repair are well known, including maximizing fault coverage to prevent test escapes and using spare elements to maximize manufacturing yield. With the surge in availability of promising non-volatile memory architectures to augment and potentially replace traditional volatile memories, a new set of SoC level memory test and repair challenges are emerging... » read more

MRAM Process Development And Production Briefing


By Dr. Meng Zhu, Dr. Roman Sappey, and Jeff Barnum MRAM (Magnetoresistive Random-Access Memory) is a type of non-volatile memory (NVM) that utilizes magnetic states to store information. The basic structure of MRAM is a magnetic-tunnel junction (MTJ), which consists of two ferromagnetic (FM) layers separated by an insulating tunnel barrier (Fig.1). When the magnetizations of the two magnetic... » read more

Taming Novel NVM Non-Determinism


New memory technologies may have non-deterministic characteristics that add calibration to the test burden — and may require recalibration during their lifetime. Many of these memories are in development as a result of the search for a storage-class memory (SCM) technology that can bridge the gap between larger, slower memories like flash and faster DRAM memory. There are several approache... » read more