tag: BiST

Challenges And Outlook Of ATE Testing For 2nm SoCs
By Sriharsha Vinjamury - 08 Aug, 2024 - Comments: 0

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of testing and ensuring manufacturability increases exponentially. 3nm silicon is a mastered art now, with yields hitting pretty high for even complex packaged silicon, while the transition from 3nm to... » read more

Are You Ready For HBM4? A Silicon Lifecycle Management (SLM) Perspective
By Faisal Goriawalla - 06 Aug, 2024 - Comments: 0

Many factors are driving system-on-chip (SoC) developers to adopt multi-die technology, in which multiple dies are stacked in a three-dimensional (3D) configuration. Multi-die systems may make power and thermal issues more complex, and they have required major innovations in electronic design automation (EDA) implementation and test tools. These challenges are more than offset by the advantages... » read more

Effective Monitoring, Test, and Repair of Multi-Die Designs
By Synopsys - 09 Jul, 2024 - Comments: 0

Despite clear advantages, there are numerous new challenges that need to be addressed for successful multi-die realization. The multi-die test challenges include: Bare chiplet level (pre-bond) Probe, dedicated/functional pads for test Test, diagnosis, and repair Interconnects (mid/post-bond) Die-to-die test access Lane test, diagnosis, and repair Multi-die ... » read more

Overview of Test Strategies for 3DICs
By Technical Paper Link - 26 Jun, 2024 - Comments: 0

A new technical paper titled "Design-for-Test Solutions for 3D Integrated Circuits" was published by researchers at Duke University, Arizona State University, and NVIDIA. Abstract: "As Moore's Law approaches its limits, 3D integrated circuits (ICs) have emerged as promising alternatives to conventional scaling methodologies. However, the benefits of 3D integration in terms of lower power co... » read more

Integration Hurdles For Analog And RF In Next-Gen Packages
By Gregory Haley - 23 May, 2024 - Comments: 0

A rapid increase in wireless connectivity and more sensors, coupled with a shift away from monolithic SoCs toward heterogeneous integration, is driving up the amount of analog/RF content in systems and changing the dynamics within a package. Since the early 2000s, the majority of chips used at the most advanced nodes were systems-on-chip (SoCs). All features had to fit into a single planar S... » read more

DRAM Test And Inspection Just Gets Tougher
By Anne Meixner - 07 Nov, 2023 - Comments: 0

DRAM manufacturers continue to demand cost-effective solutions for screening and process improvement amid growing concerns over defects and process variability, but meeting that demand is becoming much more difficult with the rollout of faster interfaces and multi-chip packages. DRAM plays a key role in a wide variety of electronic devices, from phones and PCs to ECUs in cars and servers ins... » read more

Journey From Cell-Aware To Device-Aware Testing Begins
By Laura Peters - 06 Jun, 2023 - Comments: 0

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device failures even when test programs achieved 100% fault coverage, it went about addressing this disconnect between the way defects manifest themselves inside devices and the commonly used fault mod... » read more

From Known Good Die To Known Good System With UCIe IP
By Manuel Mota - 11 May, 2023 - Comments: 0

Multi-die systems are made up of several specialized functional dies (or chiplets) that are assembled in the same package to create the complete system. Multi-die systems have recently emerged as a solution to overcome the slowing down of Moore’s law by providing a path to scaling functionality in the packaged chip in a way that is manufacturable with good yield. Additionally, multi-die sy... » read more

Optimizing Scan Test For Complex ICs
By Gregory Haley - 09 May, 2023 - Comments: 0

As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin availability. In addition, the complexity of emerging packages like 3D and chiplets necessitates comprehensive new solutions that can provide faster results at multiple stages in the silicon lifec... » read more

Designing For In-Circuit Monitors
By Ann Mutschler - 27 Apr, 2023 - Comments: 0

In every application space the semiconductor ecosystem touches, in-circuit monitors and sensors are playing an increasing role in silicon lifecycle management and concepts around reliability and resiliency — both during design as well as in the field. The combination of true system-level design, in/on-chip monitors, and improved data analysis are expected to drastically improve reliability... » read more

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