tag: Synopsys

Effective Monitoring, Test, and Repair of Multi-Die Designs
By Synopsys - 09 Jul, 2024 - Comments: 0

Despite clear advantages, there are numerous new challenges that need to be addressed for successful multi-die realization. The multi-die test challenges include: Bare chiplet level (pre-bond) Probe, dedicated/functional pads for test Test, diagnosis, and repair Interconnects (mid/post-bond) Die-to-die test access Lane test, diagnosis, and repair Multi-die ... » read more

Digital Twins Find Their Footing In IC Manufacturing
By Laura Peters - 09 Jul, 2024 - Comments: 0

Momentum is building for digital twins in semiconductor manufacturing, tying together the various processes and steps to improve efficiency and quality, and to enable more flexibility in the fab and assembly house. The movement toward digital twins opens up a slew of opportunities, from building and equipping new fabs faster to speeding yield ramps by reducing the number of silicon-based tes... » read more

Holistic Verification and Validation of Automotive IP for Functional Safety SoCs
By Synopsys - 03 Jul, 2024 - Comments: 0

Automotive functional safety systems have strict requirements to help avoid damages to life and property in case of a failure. As technology becomes more complex, there are increasing safety-related risks from systematic failures and random hardware failures that must be considered during product development. Standards like ISO 26262 provide guidance to mitigate such safety-related risks, by de... » read more

Security Focus Widens To HW, SW, Ecosystems
By Ann Mutschler - 02 Jul, 2024 - Comments: 0

Hardware security strategies are pushing much further left in the chip design flow as the number of vulnerabilities in complex designs and connected devices continues to grow, taking into account potential vulnerabilities in both hardware and software, as well as the integrity of an extended global supply chain. These approaches leverage the speed of fixing problems in software, and the effe... » read more

Verification Tools Straining To Keep Up
By Brian Bailey - 01 Jul, 2024 - Comments: 0

Verification engineers are the unsung heroes of the semiconductor industry, but they are at a breaking point and desperately in need of modern tools and flows to deal with the rapidly increasing pressures. Verification is no longer just about ensuring that functionality is faithfully represented in an implementation. That alone is an insolvable task, but verification has taken on many new re... » read more

Chip Industry Week In Review
By The SE Staff - 28 Jun, 2024 - Comments: 0

The Design Automation Conference morphed into the Chips to Systems Conference, reflecting an industry shift from monolithic SoCs to assemblies of chiplets in various flavors of advanced packaging. The change drew a slew of students and a resurgent buzz, fueled by discussions about heterogeneous integration, reliability, and ways to leverage AI/ML to speed up design and verification processes. ... » read more

Digital Twins Gaining Traction In Complex Designs
By Ann Mutschler - 27 Jun, 2024 - Comments: 0

The integration of heterogeneous chiplets into an advanced package, coupled with the increasing digitalization of multiple industry segments, is pushing digital twins to the forefront of design. The challenge in these complex assemblies is figuring out the potential tradeoffs between different chiplets, different assembly approaches, and to be able to do it quickly enough to still hit market... » read more

Enabling 2.5D/3D Multi-Die Package
By Kenneth Larsen - 27 Jun, 2024 - Comments: 1

In the rapidly evolving world of ASIC design, the shift from monolithic to 2.5D and 3D multi-die architectures represents a significant leap forward. This approach, which integrates multiple chiplets (also knowns as dies) into a single package, demands not only a new level of IC design innovation but also an increased complexity in coordination and integration. At the forefront of this technolo... » read more

Accelerate Test Regressions with Synopsys VIP Using Dynamic Test Loading in VCS
By Synopsys - 27 Jun, 2024 - Comments: 0

Functional verification ensures that a design meets its specification requirements. The initial 80% of the verification process significantly impacts the time needed to complete the final 20%, which involves extensive test scenarios and regression testing, often consuming substantial engineering resources. Typically, the desired scenario emerges late in the test case, often in the last minutes ... » read more

Data Coherence Across Silos And Hierarchy
By Brian Bailey - 27 Jun, 2024 - Comments: 0

Shift left has become a rallying cry for the chip design industry, but unless coherent data can flow between the groups being impacted, the value may not be as great as expected. Shift left is a term that encompasses attempts to bring analysis and decision-making forward in the development process. The earlier an issue can be found, the less of a problem it ultimately becomes. But in many ca... » read more

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