tag: Synopsys

Blog Review: March 15
By Jesse Allen - 15 Mar, 2023 - Comments: 0

Siemens EDA's Dan Yu finds that high-quality, well-connected mass data are crucial to the success of applying machine learning to verification and recommends teams pivot to a data-centric workflow. Synopsys' Shankar Krishnamoorthy suggests that deploying AI-driven chip design and verification can free teams from iterative work, letting them focus instead on product differentiation and PPA en... » read more

Self-Heating Issues Spread
By Brian Bailey - 13 Mar, 2023 - Comments: 1

With every new node there are additional physical effects that must be considered, but not all of them are of the same level of criticality. One that is being mentioned more frequently is self-heating. All devices consume power and when they do that, it becomes heat. "In essence, all active devices generate heat as carriers move, creating channels for current to pass through the gates," says... » read more

Week In Review: Design, Low Power
By Jesse Allen - 10 Mar, 2023 - Comments: 0

Arm is expected to list solely on a U.S. stock exchange when it goes public again later this year, forgoing the London Stock Exchange for now, the BBC reports. Global investment banks expect the offering to value the company between $30 billion and $70 billion, according to Bloomberg. Disaggregating chips into specialized processors, memories, and architectures is becoming necessary for cont... » read more

100G Ethernet IP For Edge Computing
By Jerry Lotto - 09 Mar, 2023 - Comments: 0

The presence of Ethernet in our lives has paved the way for the emergence of the Internet of Things (IoT). Ethernet has connected everything around us and beyond, from smart homes and businesses, to industries, schools, and governments. This specification is even found in our vehicles, facilitating communication between internal devices. Ethernet has enabled high-performance computing data cent... » read more

Uneven Circuit Aging Becoming A Bigger Problem
By Ann Mutschler - 09 Mar, 2023 - Comments: 0

Circuit aging is emerging as a first-order design challenge as engineering teams look for new ways to improve reliability and ensure the functionality of chips throughout their expected lifetimes. The need for reliability is obvious in data centers and automobiles, where a chip failure could result in downtime or injury. It also is increasingly important in mobile and consumer electronics, w... » read more

What Makes RISC-V Verification Unique?
By Brian Bailey - 09 Mar, 2023 - Comments: 0

Semiconductor Engineering sat down to discuss the verification of RISC-V processors with Pete Hardee, group director for product management at Cadence; Mike Eftimakis, vice president for strategy and ecosystem at Codasip; Simon Davidmann, founder and CEO of Imperas Software; Sven Beyer, program manager for processor verification at Siemens EDA; Kiran Vittal, senior director of alliances partner... » read more

Blog Review: March 8
By Jesse Allen - 08 Mar, 2023 - Comments: 0

Synopsys' Rahul Thukral and Bhavana Chaurasia find that embedded MRAM is undergoing an uplift in utilization for low-power, advanced-node SoCs thanks to its high capacity, high density, and ability to scale to lower geometries. Siemens EDA's Chris Spear dives into the UVM Factory with a look at the  SystemVerilog Object-Oriented Programming concepts behind the factory. Cadence's Veena Pa... » read more

How Low Can You Go? Pushing The Limits Of Transistors
By Synopsys - 08 Mar, 2023 - Comments: 0

Deep low voltage enablement of embedded memories and logic libraries to achieve extreme low power: Rising demand for cutting-edge mobile, IoT, and wearable devices, along with high compute demands for AI and 5G/6G communications, has driven the need for lower power systems-on-chip (SoCs). This is not only a concern for a device’s power consumption when active (dynamic power), but also when... » read more

Test Challenges Mount As Demands For Reliability Increase
By Anne Meixner - 07 Mar, 2023 - Comments: 0

An emphasis of improving semiconductor quality is beginning to spread well beyond just data centers and automotive applications, where ICs play a role in mission- and safety-critical applications. But this focus on improved reliability is ratcheting up pressure throughout the test community, from lab to fab and into the field, in products where transistor density continues to grow — and wh... » read more

Compiler Optimization Made Easy
By Nozar Nozarian - 07 Mar, 2023 - Comments: 0

In a previous blog post, we discussed the benefits of using automation to maximize the performance of a system. One use case I mentioned was compiler flag mining, and the fact that performance is available beyond the standard optimization flags provided by most compilers. Getting to this untapped performance is a difficult problem to solve, but fortunately there is an easy way. A universe of o... » read more

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