tag: Advantest

The Development Of Front-End Module For 5G Millimeter-Wave Device Testing
By Advantest - 11 Oct, 2022 - Comments: 0

This article describes the development of a front-end module for 5G millimeter-wave device testing. 5G millimeter-wave is planned to be used up to the 53 GHz band. Our challenges are to optimize the performance of our test system up to that frequency band including wide power range of EVM performance, and to add a new one-port S-Parameter measurement function. We describe the elemental technolo... » read more

Week In Review: Semiconductor Manufacturing, Test
By Karen Heyman - 07 Oct, 2022 - Comments: 0

Micron selected Syracuse, New York as the site for its new megafab complex, which is expected to create 9,000 company jobs and 40,000 construction and supply chain jobs. President Biden called it “another win for America.” The chip manufacturing facility will be the nation’s largest, including a 7.2 million square foot complex and 2.4 million square foot of cleanroom. Site preparation wil... » read more

Week In Review: Manufacturing, Test
By Karen Heyman - 16 Sep, 2022 - Comments: 0

President Biden signed an executive order on Sept. 15, limiting foreign investments in U.S. technology by "competitor or adversarial nations" that are deemed a threat to national security. In the past, the Committee on Foreign Investment in the United States (CFIUS) largely limited its actions to the sale of U.S. companies. The new directive expands that to include investments involving "U.S. s... » read more

Making 5G More Reliable
By Ed Sperling - 08 Sep, 2022 - Comments: 0

The rollout of 5G is a complex and monumental effort involving multiple separate systems that need to function flawlessly together in real-time, making it difficult to determine where problems might arise, or how and when to test for them. Investments in 5G have been underway for the better part of a decade, and the technology is considered the next huge growth opportunity for mobile devices... » read more

Enabling Test Strategies For 2.5D, 3D Stacked ICs
By Laura Peters - 08 Sep, 2022 - Comments: 0

Improved testability, coupled with more tests at more insertion points, are emerging as key strategies for creating reliable, heterogeneous 2.5D and 3D designs with sufficient yield.  Many changes need to fall into place to make side-by-side 2.5D and 3D stacking approaches cost-effective, particularly for companies looking to integrate chiplets from different vendors. Today, nearly all of t... » read more

The Drive Toward More Predictive Maintenance
By Anne Meixner - 08 Sep, 2022 - Comments: 0

Maintenance is a critical behind-the-scenes activity that keeps manufacturing facilities running and data centers humming. But when not performed in a timely manner, it can result in damaged products or equipment, or significant system/equipment downtime. By shifting from scheduled maintenance to predictive maintenance, factories and electronic system owners can reap substantial benefits, in... » read more

Open-Short Normalization Method For A Quick Defect Identification In Branched Traces With High-Resolution Time-Domain Reflectometry
By Advantest - 07 Sep, 2022 - Comments: 0

Time-domain reflectometry (TDR) that employs electro-optical sampling affords excellent resolution at the femtosecond level and exhibits a comprehensible impulse waveform, thereby allowing quick defect identification in a single trace. However, it remains challenging to identify a defect in a trace of multiple branches; the TDR waveform is complex. Generally, the TDR waveform of a defective uni... » read more

Week In Review: Manufacturing, Test
By Karen Heyman - 19 Aug, 2022 - Comments: 0

The U.S. Commerce Department issued export controls on key technologies, including gallium oxide (Ga2O3) and diamond substrates, which are used at high voltages and temperatures, as well as EDA tools specifically developed for GAA FETs. It's not clear how this will impact EDA companies, because many of the tools that will be used for designing for GAA FETs already are in use today for finFETs. ... » read more

Making The Most Of Data Lakes
By Anne Meixner - 09 Aug, 2022 - Comments: 0

Having all the semiconductor data available is increasingly necessary for improving manufacturability, yield, and ultimately the reliability of end devices. But without sufficient knowledge of relationships between data from different processes and computationally efficient data structures, the value of any data is significantly reduced. In the semiconductor industry, reducing waste, decreas... » read more

GaN 8Gbps High-Speed Relay MMIC For Automated Test Equipment
By Advantest - 09 Aug, 2022 - Comments: 0

An 8 Gbps high-speed relay MMIC for an Automated Test Equipment (ATE) using a gallium nitride is developed and evaluated. Metal-Insulator-Semiconductor structure with a tantalum oxynitride is employed to reduce a leakage current for ATE applications. The fabricated MMIC shows 0.3 nA of the leakage current, 12 GHz of a －3 dB bandwidth, and excellent eye-opening of 8 Gbps signals with a 18-lead... » read more

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