tag: Advantest

Week In Review: Manufacturing, Design, Test
By Mark LaPedus - 17 Jan, 2014 - Comments: 0

A new study from Crucial.com reveals that on some days, 64% of U.S. parents spend more time with their computers than with family or close friends. TSMC posted mixed results in the fourth quarter of 2013. It also announced flat CapEx targets for 2014. TSMC also addressed Intel’s recent comments about TSMC’s finFET plans. Morris Chang, chairman of TSMC, said Intel’s comments are mislead... » read more

The Week In Review: Manufacturing And Design
By Mark LaPedus - 10 Jan, 2014 - Comments: 1

Crucial.com reveals a surprising way to gain more time for improving one's personal health: fix a slow computer. A nationwide survey revealed that U.S. adults think they waste an average of 16 minutes per day waiting for their computer to load or boot up. Equating to two hours each week and four days per year lost to the wiles of a slow computer, it's no surprise that 66% of Americans say that ... » read more

The Week In Review: Manufacturing And Design
By Mark LaPedus - 03 Jan, 2014 - Comments: 0

Blocking cell phone use and texting while driving have been proposed by the U.S. government and for good reason. About 10 people a day are killed in “distraction-affected” car accidents in the U.S., according to the U.S. National Highway Traffic Safety Administration. As a result, some companies are developing technologies that can block texts while driving. But according to Strategy Analyt... » read more

The Week In Review: Manufacturing & Design
By Mark LaPedus - 06 Dec, 2013 - Comments: 0

A new study reveals that a majority of Americans are making some costly miscalculations regarding the performance of their existing PCs. The survey reveals that Americans lack financial savvy when faced with slow computers. Germany’s Merck KGaA, a pharmaceutical, chemical and life science company, announced an agreement with AZ Electronic Materials, under which Merck KGaA would acquire AZ.... » read more

TSVs: Welcome To The Era Of Probably Good Die
By Jeff Chappell - 21 Oct, 2013 - Comments: 0

Among the challenges of a widespread adoption of 3D ICs is how to test them, particularly when it comes to through-silicon vias (TSVs). While not necessarily presenting a roadblock, TSVs use in the mainstream will almost certainly change traditional test strategies. In fact for many chipmakers looking to stack their silicon, they may come to rely less on the traditional known good die (KGD) ... » read more

ATE Market Changes With The Times
By Jeff Chappell - 15 Aug, 2013 - Comments: 0

By Jeff Chappell A declining PC market in recent years coupled with the continuing growth of mobile phones and tablets has meant changes throughout the semiconductor supply chain, and automated test equipment is no exception. For example, a decade ago memory test—namely DRAM—was a large market compared with that of nascent system-on-a-chip (SoC) testing. In fact, at the time some test e... » read more

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