tag: AI

Trusted Sensor Technology For The Internet Of Things
By Dirk Mayer - 27 Mar, 2023 - Comments: 0

“Data is the new oil” — Clive Humby, 2006 While this prediction relates to the value that can be generated from data, the focus here is on the tools at the oil well. Just as oil drilling platforms are expected to reliably produce crude oil around the clock, sensors are expected to reliably and continuously deliver high-quality data. But sensors have long since evolved from simple me... » read more

AI Becoming More Prominent In Chip Design
By Ed Sperling - 27 Mar, 2023 - Comments: 0

Semiconductor Engineering sat down to talk about the role of AI in managing data and improving designs, and its growing role in pathfinding and preventing silent data corruption, with Michael Jackson, corporate vice president for R&D at Cadence; Joel Sumner, vice president of semiconductor and electronics engineering at National Instruments; Grace Yu, product and engineering manager at Meta... » read more

Week In Review: Manufacturing, Test
By Karen Heyman - 24 Mar, 2023 - Comments: 0

TEL announced plans to build a ¥2.2 billion ($168.2 million) production and logistics center at its Tohoku Office to increase capacity. Construction of the 57,000m² facility, which will be used for manufacturing thermal processing and single-wafer deposition systems, is slated to start in spring 2024, and expected to be completed in fall 2025. Toshiba's board voted in favor of a 2 trillio... » read more

Looking Beyond TOPS/W: How To Really Compare NPU Performance
By Paul Karazuba - 23 Mar, 2023 - Comments: 0

There is a lot more to understanding the true capabilities of an AI engine beyond TOPS per watt. A rather arbitrary measure of the number of operations of an engine per unit of power, the TOPS/W metric completely misses the point that a single operation on one engine may accomplish more useful work than a multitude of operations on another engine. In any case, TOPS/W is by no means the only spe... » read more

How AI Drives Faster Verification Coverage And Debug For First-Time-Right Silicon
By Taruna Reddy - 23 Mar, 2023 - Comments: 0

By Taruna Reddy and Robert Ruiz These days, the question is less about what AI can do and more about what it can’t do. From talk-of-the-town chatbots like ChatGPT to self-driving cars, AI is becoming pervasive in our everyday lives. Even industries where it was perhaps an unlikely fit, like chip design, are benefiting from greater intelligence. What if one of the most laborious, time-co... » read more

A Hierarchical And Tractable Mixed-Signal Verification Methodology For First-Generation Analog AI Processors
By Siemens EDA - 22 Mar, 2023 - Comments: 0

Artificial intelligence (AI) is now the key driving force behind advances in information technology, big data and the internet of things (IoT). It is a technology that is developing at a rapid pace, particularly when it comes to the field of deep learning. Researchers are continually creating new variants of deep learning that expand the capabilities of machine learning. But building systems th... » read more

Getting Smarter About Tool Maintenance
By Anne Meixner - 16 Mar, 2023 - Comments: 0

Chipmakers have begun to shift to predictive maintenance for process tools, but the hefty investment in analytics and engineering efforts means it will take some time for smart maintenance to become a widespread practice. Semiconductor manufacturers need to maintain a diverse set of equipment to process the flow of wafers, dies, packaged parts, and boards running through factories. OSAT and ... » read more

AI Benchmarks Are Broken
By Jon Bunting - 14 Mar, 2023 - Comments: 0

Artificial Intelligence (AI) is shaping up to be one of the most revolutionary technologies of our time. By now you’ve probably heard that AI’s impact will transform entire industries, from healthcare to finance to entertainment, delivering us richer products, streamlined experiences, and augment human productivity, creativity, and leisure. Even non-technologists are getting a glimpse of... » read more

A Hierarchical And Tractable Mixed-Signal Verification Methodology For First-Generation Analog AI Processors
By Siemens EDA - 08 Mar, 2023 - Comments: 0

Artificial intelligence (AI) is now the key driving force behind advances in information technology, big data and the internet of things (IoT). It is a technology that is developing at a rapid pace, particularly when it comes to the field of deep learning. Researchers are continually creating new variants of deep learning that expand the capabilities of machine learning. But building systems th... » read more

Test Challenges Mount As Demands For Reliability Increase
By Anne Meixner - 07 Mar, 2023 - Comments: 0

An emphasis of improving semiconductor quality is beginning to spread well beyond just data centers and automotive applications, where ICs play a role in mission- and safety-critical applications. But this focus on improved reliability is ratcheting up pressure throughout the test community, from lab to fab and into the field, in products where transistor density continues to grow — and wh... » read more

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