Three Levers for Accelerating Lightweighting in Aerospace: Advanced Materials, Additive Manufacturing, Materials Intelligence


Accelerating the delivery of lighter weight aircraft is possible by focusing on three key levers: more extensive use of advanced materials, broader adoption of new manufacturing techniques and extraction of more value from existing materials data. This white paper delves into the opportunities and challenges presented by each, and provides best practices for reducing fuel costs and emissions th... » read more

Reliability At 5nm And Below


The best way to figure out how a chip or package will age is to bake it in an oven, heat it in a pressure cooker, and stick it in a freezer. Those are all standard methods to accelerate physical effects and the effects of aging, but it's not clear they will continue working as chips shrink to 5nm and 3nm, or as they are included in multi-die packages. Extending any of those kitchen-like appr... » read more

Improving Reliability Monitoring Of High-Bandwidth Memory


As the quest for increased bandwidth and speed continues, multi-die technologies with advanced memory architectures are introduced. As the complexity of these heterogenous packaging continues to develop, new reliability challenges arise. A new approach to HBM subsystem monitoring and repair provides advanced in-field reliability assurance. By applying analytics to data created by on-chip Age... » read more

November 2019 Startup Funding


During November, 16 tech startups raised private funding rounds of $100 million or more, together receiving $3.42 billion. Investors were drawn to many of the same technology fields that were popular in 2019 — automotive and mobility tech, artificial intelligence and machine learning, cybersecurity, platforms, semiconductors, and software. Analytics of multiple different types were big in ... » read more

Verification In The Era Of Autonomous Driving, Artificial Intelligence And Machine Learning


The last couple of weeks have been busy with me participating on three panels that dealt with AI and machine learning in the contexts of automotive and aero/defense, in San Jose, Berlin and Detroit. The common theme? Data is indeed the new oil, and it messes with traditional value creation in electronics. Also, requirements for system design and verification are changing and there are completel... » read more

Changes In Data Storage and Usage


Doug Elder, vice president and general manager of OptimalPlus, talks about what’s changing in the storage and collection, including using data lakes and data engineering to break down silos and get data into a consistent format, and why it’s essential to define data up front based upon how quickly it needs to be accessed, as well as who actually owns the data. » read more

Testing Against Changing Standards In Automotive


The infusion of more semiconductor content into cars is raising the bar on reliability and changing the way chips are designed, verified and tested, but it also is raising a lot of questions about whether companies are on the right track at any point in time. Concerns about liability are rampant with autonomous and assisted driving, so standards are being rolled out well in advance of the te... » read more

Process Window Optimization


David Fried, vice president of computational products at Lam Research, examines increasing process variation and interactions between various types of variation, why different approaches are necessary to improve yield and continue scaling. » read more

5 Steps To Data-Driven Manufacturing


There is a lot of hype surrounding “Industry 4.0,” “Smart Manufacturing,” “the Industrial Internet of Things (IIoT),” and other associated terms, but it all boils down to one question: How do I become a data-driven manufacturer? Companies strive to be data driven, realizing that decisions will be more objective and more likely to achieve the desired results. In fact, many compani... » read more

Using Better Data To Shorten Test Time


The combination of machine learning plus more sensors embedded into IC manufacturing equipment is creating new possibilities for more targeted testing and faster throughput for fabs and OSATs. The goal is to improve quality and reduce the cost of manufacturing complex chips, where time spent in manufacturing is ballooning at the most advanced nodes. As the number of transistors on a die incr... » read more

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