tag: analytics

Improving IC System Quality And Performance
By Ed Sperling - 12 Nov, 2025 - Comments: 0

Ensuring that multi-die assemblies and advanced SoCs will work as expected from time zero to the end of their lifecycle adds new challenges for chipmakers and their customers. Chips are being run harder, hotter, and for longer periods of time, often in unique configurations and with customized workloads. Alex Burlak, vice president of test and analytics at proteanTecs, talks about how to identi... » read more

AI In Test Analytics: Promise Vs. Reality
By Gregory Haley - 11 Nov, 2025 - Comments: 0

The semiconductor industry is increasingly turning to artificial intelligence as the solution for increasing complexity in test analytics, hoping algorithms can tame the growing flood of production data. The need to extract actionable insight from that torrent is pressing. AI/ML (AI) models promise to find correlations buried in multidimensional datasets, predict failures before they occur, and... » read more

AI In Chip Design: Tight Control Required
By Ed Sperling - 16 Jul, 2025 - Comments: 0

Executive Outlook: Semiconductor Engineering sat down with a panel of experts to talk about what's needed to effectively leverage AI, who benefits from it, and where software-defined hardware works best, with Bill Mullen, Ansys fellow; John Ferguson, senior director of product management at Siemens EDA; Chris Mueth, senior director of new markets and strategic initiatives at Keysight; Albert Ze... » read more

Need For Speed Drives Targeted Testing
By Gregory Haley - 23 Apr, 2025 - Comments: 0

As packaging complexity increases and nodes shrink, defect detection becomes significantly more difficult. Engineers must contend with subtle variations introduced during fabrication and assembly without sacrificing throughput. New material stacks degrade signal-to-noise ratios, which makes metrology more difficult. At the same time, inspection systems face a more nuanced challenge — how t... » read more

What’s Changing In Outlier Detection
By Ed Sperling - 12 Mar, 2025 - Comments: 0

Commonly used outlier detection approaches, such as parts average testing or determining whether a die is good based upon other dies in the immediate neighborhood, are falling short in advanced packages and SoCs. Some devices may pass tests and still fail in the field. In the past, this was solved by adding margin into designs, but that margin now takes too big a bite out of performance and pow... » read more

AI’s Power To Transform Semiconductor Design And Manufacturing
By John Kibarian - 28 Oct, 2024 - Comments: 0

Artificial intelligence and machine learning (AI/ML) have immense power to transform semiconductor design and manufacturing for a variety of broad and far-ranging applications. Just consider the volume of data generated by design and manufacturing each year. With increasingly complex products, machines, processes and supply chains, the overall amount of data associated with semiconductor making... » read more

IC Industry’s Growing Role In Sustainability
By Ann Mutschler - 17 Jun, 2024 - Comments: 1

The massive power needs of AI systems are putting a spotlight on sustainability in the semiconductor ecosystem. The chip industry needs to be able to produce more efficient and lower-power semiconductors. But demands for increased processing speed are rising with the widespread use of large language models and the overall increase in the amount of data that needs to be processed. Gartner estima... » read more

IC Test And Quality Requirements Drive New Collaboration
By Laura Peters - 09 Apr, 2024 - Comments: 0

Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how chips are tested and monitored. At the core of this shift is a growing recognition that no company can do everything, and that to work together will require much tighter integration of flows, met... » read more

Plugging Gaps In The IC Supply Chain
By Anne Meixner - 09 Jan, 2024 - Comments: 0

Multiple touch points in manufacturing and packaging are exposing gaps in the data used to track different components, making it difficult to identify the source of issues that can affect yield and reliability, and opening the door to counterfeit or sub-standard parts. This involves more than just assigning a simple identifying code to a chip. At different points in a device's lifecycle, new... » read more

Improving Reliability In Chips
By Anne Meixner - 12 Sep, 2023 - Comments: 1

Semiconductor Engineering sat down to discuss changes in test that address tracing device quality throughout a product’s lifetime with Tom Katsioulas, CEO at Archon Design Solutions and U.S. Department of Commerce IoT advisory board member; Ming Zhang, vice president of R&D Acceleration at PDF Solutions; and Uzi Baruch, chief strategy officer at proteanTecs. What follows are excerpts of t... » read more

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