Pain Management


In part one of this series, the focus was on overlapping and new pain points in the semiconductor flow, from initial conception of what needs to be in a chip all the way through to manufacturing. Part two looks at how companies are attempting to manage that pain. It’s no secret that [getkc id="81" kc_name="SoC"]s are getting more complicated to design, debug and build, but the complexity i... » read more

Power Delivery Network Verification Coverage


This paper presents a methodology for comprehensive power grid verification coverage, including identification of power grid weaknesses early in the design cycle. To view this white paper, click here. » read more

EDA Shapes Its Future


In part one of this series, Semiconductor Engineering looked at growth within the EDA industry and the types of approaches being made to expand the scope of the markets that they serve. Scope expansion comes from the creation of new tools, the growth of companies in the IP space and the various ways in which opportunities can be found in new markets. Additional growth opportunities come from so... » read more

Blog Review: March 19


ARM’s Diya Soubra has discovered an interesting term in relation to the Internet of Things: Compound Applications. Will that make the IoT more compelling? Mentor’s Colin Walls points to some less obvious reasons for choosing a processor. No. 4 on his list is particularly noteworthy. Synopsys’ Mick Posner has some thoughts about wearable computing prototypes. Check out the top pho... » read more

More Pain In More Places


Pain is nothing new in to the semiconductor industry. In fact, the pain of getting complex designs completed on budget, and finding the bugs in those designs, has been responsible for decades of continuous growth in EDA, IP, test, packaging, and foundries. But going forward there is change afoot in every segment of the flow from architecture to design to layout to verification to manufacturi... » read more

FinFET Reliability Issues


The 16nm FinFET node has introduced several new challenges in the IC design community. In addition to the complexity of power-noise and electromigration (EM) verification, thermal reliability has become a major concern for both chip and package designers. With the three-dimensional architecture of FinFET devices, new simulation approaches are being used to model thermal behavior of the die in o... » read more

The Next Bigger Things


When the Internet of Things really started making headlines several years ago—the concept had been around since at least the early 1990s—the assumption was that most of the semiconductors involved in sensing and communicating would be simple, highly limited, and developed using older technology. As the concept evolves and grows, however, it’s beginning to take on a whole new texture. R... » read more

Know What To Look For


With the number of power domains exploding in today’s ICs, it’s extremely difficult to include all different modes of complexity in the verification. “The problem was already challenging enough,” observed Mark Baker, director of product marketing at Atrenta. “Just looking at where SoC design was going was a collection of various IPs, the different communication protocols, the bus ... » read more

10 Must Knows About Virtual Prototypes


1. What is a virtual prototype? If you ask a room full of people to define ‘system’, you will get as many answers as there are people in the room. The same is true for virtual prototypes. A virtual prototype defines a model of something that is usually created by one group and used by another with some implied abstraction. It is a prototype that exists as a software model on which analysis... » read more

EDA Hungers For Growth


Look at the top line numbers provided by the EDA industry consortium (EDAC) and it appears as if the industry is doing well. In 2010, revenue was $5.285 billion. That number increased to $6.218 billion in 2011, and again to $6.529 billion in 2012, a 9.5% annual growth rate that would satisfy most investors. But the numbers do not tell the whole story. There is an interesting divide growing betw... » read more

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