tag: ATE

System-Level Test: Where Does It Fit?
By Astronics - 17 Sep, 2018 - Comments: 0

Our second C-Brief discusses where system-level test (SLT) best fits into your semiconductor test workflow. With automated testing equipment (ATE), a traditional workflow may consist of: Wafer sort (WS) Burn-in after packaging (BI) Combination of structural testing (ST) and functional testing (FT). As demands on high-volume manufacturing shift in response to wider industry and com... » read more

Accelerating Test Pattern Bring-Up For Rapid First Silicon Debug
By Mentor, a Siemens Business - 22 Aug, 2018 - Comments: 0

Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test patterns to a tester-specific format and generating a test program that is executed by Automatic Test Equipment (ATE). This standard silicon bring-up flow is becoming too slow and expensive, especially fo... » read more

What’s in a Name?
By Jeff Dorsch - 06 Aug, 2018 - Comments: 0

Test Vision 2020 is a specialty workshop held each year during Semicon West. Formerly known as ATE Vision 2020, the program focuses on automatic test equipment and related topics. This year’s edition heard a lot about artificial intelligence, automotive electronics, and machine learning, which have been the leading topics at every tech conference I’ve attended in 2018. The workshop’s t... » read more

Accelerating Test Pattern Bring-Up For Rapid First Silicon Debug
By Mentor, a Siemens Business - 12 Jul, 2018 - Comments: 0

Reducing the time spent on silicon bring-up is critical in getting ICs into the hands of customers and staying competitive. Typically, the silicon bring-up process involves converting the test patterns to a tester-specific format and generating a test program that is executed by Automatic Test Equipment (ATE). This standard silicon bring-up flow is becoming too slow and expensive, especially fo... » read more

NIWeek Test Talk
By Jeff Dorsch - 12 Jul, 2018 - Comments: 0

Semiconductor Engineering sat down with David Hall, Chief Marketer, Semiconductor, of National Instruments, and Mike Watts, NI’s Senior Solutions Marketer, Semiconductor Test, during NIWeek 2018 in Austin, Texas. “One of the opportunities for National Instruments is that over the last 10 years, we’ve seen larger semiconductor organizations change the way they do testing both for R&... » read more

The Best in Test
By Jeff Dorsch - 11 Jun, 2018 - Comments: 0

“The 10 Best Semiconductor Equipment Supplier Rankings for 2018” was recently released by VLSI Research. Teradyne and Advantest placed first and second, respectively, in the large-company rankings, each rating five stars, based on evaluations by customers. Xcerra placed fifth in the focused-company rankings, with four-and-a-half stars. The market research firm also ranked the top vendors... » read more

Xcerra’s Stock Buoyed by Busted Deal
By Jeff Dorsch - 09 Apr, 2018 - Comments: 0

The stock chart for XCRA, Xcerra’s common shares traded on the Nasdaq Global Select Market, looks like a hockey stick since late February, when the company called off its acquisition by Chinese investors in the face of opposition by the federal Committee on Foreign Investment in the United States. That busted deal may prove to be a blessing in disguise for Xcerra, which posts impressive finan... » read more

Xcerra: Back to the Drawing Board
By Jeff Dorsch - 05 Mar, 2018 - Comments: 0

It’s been nearly two weeks since Xcerra and Hubei Xinyan Equity Investment Partnership announced they have terminated their merger agreement in the face of apparent opposition by the Committee on Foreign Investment in the United States, the federal interagency panel that reviews transactions for their impacts on national security. Xcerra and Hubei Xinyan also withdrew their CFIUS application.... » read more

Looking At Test Differently
By Ed Sperling - 05 Mar, 2018 - Comments: 1

Wilhelm Radermacher, executive advisor at [getentity id="22816" e_name="Advantest"], sat down with Semiconductor Engineering to discuss how the impact of rapid market changes, advanced packaging approaches and increasing complexity on test strategies and equipment. What follows are excerpts of that conversation. SE: As we move into new markets where use models and stresses on devices are dif... » read more

ATE Tailwind For 2018?
By Jeff Dorsch - 05 Feb, 2018 - Comments: 0

The automatic test equipment market enjoyed a record sales year during 2017, and there are indications that the good times will continue this year. Forecasters are predicting another robust year for sales of DRAMs and NAND flash memory devices, especially 3D NAND. That will drive demand for memory test equipment to keep up. Frost & Sullivan predicts semiconductor test equipment will h... » read more

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