tag: BTI

Uneven Circuit Aging Becoming A Bigger Problem
By Ann Mutschler - 09 Mar, 2023 - Comments: 0

Circuit aging is emerging as a first-order design challenge as engineering teams look for new ways to improve reliability and ensure the functionality of chips throughout their expected lifetimes. The need for reliability is obvious in data centers and automobiles, where a chip failure could result in downtime or injury. It also is increasingly important in mobile and consumer electronics, w... » read more

RETBLEED: New Spectre-BTI Attack (ETH Zurich)
By Technical Paper Link - 13 Jul, 2022 - Comments: 0

New Spectre-BTI attack that "leaks arbitrary kernel memory." It's detailed in this research paper titled “RETBLEED: Arbitrary Speculative Code Execution with Return Instructions” from researchers at ETH Zürich. Mitigations are available. Abstract "Modern operating systems rely on software defenses against hardware attacks. These defenses are, however, as good as the assumptions they m... » read more

NBTI & PBTI of MOSFETs
By Technical Paper Link - 30 May, 2022 - Comments: 0

Technical paper titled "Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction" from researchers at Liverpool John Moores University. Abstract "CMOS technology dominates the semiconductor industry, and the reliability of MOSFETs is a key issue. To optimize chip design, trade-offs between reliability, speed, power consumption, and cost must be carried out. This r... » read more

What’s Holding Back Aging Simulation?
By Andre Lange - 09 Apr, 2020 - Comments: 0

Aging simulation supplies information about the long-term behavior before an IC enters into production, providing an important early evaluation of the reliability required by the application and specification. Re-designs due to reliability issues, and over-design with excessive safety margins, are avoided in this way. In addition, the long-term stability can be demonstrated to the customer. ... » read more

System-Level Power Modeling Takes Root
By Ann Mutschler - 10 May, 2018 - Comments: 0

Power, heat, and their combined effects on aging and reliability, are becoming increasingly critical variables in the design of chips that will be used across a variety of new and existing markets. As more processing moves to edge, where sensors are generating a tsunami of data, there are a number of factors that need to be considered in designs. On one side, power budgets need to reflect th... » read more

Multiphysics Reliability Signoff For Next-Gen Auto Electronics Systems
By Annapoorna Krishnaswamy - 12 Mar, 2018 - Comments: 0

The automotive industry is in the midst of a sea change. Growing market needs for electrification, connectivity on the go, advanced driver assistance systems, and ultimately the goal of autonomous driving, are creating newer requirements and greater challenges. A chassis on four wheels is now fitted with cameras, radar and other sensors, which will be the eyes of the driverless car, as well as ... » read more

Understanding Your Chip’s Age
By Ramsay Allen - 08 Feb, 2018 - Comments: 1

A Q&A with Moortec CTO Oliver King. Why is understanding your chip's age important? Semiconductor devices age over time, we all know that, but what is often not well understood are the mechanisms for aging or the limits that will cause a chip to fail. In addition, there is bound to be a requirement for a minimum lifetime of a device which will depend on application but could be two or... » read more

Noise Abatement
By Brian Bailey - 12 Oct, 2017 - Comments: 0

[getkc id="285" kc_name="Noise"] is a fact of life. Almost everything we do creates noise as a by-product and quite often what is a signal to one party is noise to another. Noise cannot be eliminated. It must be managed. But is noise becoming a larger issue in chips as the technology nodes get smaller and packaging becomes more complex? For some, the answer is a very strong yes, while for ot... » read more

Will Self-Heating Stop FinFETs
By Katherine Derbyshire - 20 Apr, 2017 - Comments: 0

New transistor designs and new materials don’t appear out of thin air. Their adoption always is driven by the limitations of the incumbent technology. Silicon germanium and other compound semiconductors are interesting because they promise superior carrier mobility relative to silicon. [getkc id="185" kc_name="FinFET"] transistor designs help minimize short channel effects, a critical limi... » read more

MEMS: Improving Cost And Yield
By Ed Sperling - 13 Mar, 2017 - Comments: 2

MEMS devices inspire awe on the design side. On the test and manufacturing side, they evoke a different kind of reaction. These are, after all, the intersection of mechanical and electrical engineering—a joining of two miniature worlds that are the basis of some of the most complex technology on the planet. But getting these devices to yield sufficiently, understanding what does or does no... » read more

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