Gates Add Functionality, But Wires Create Problems


Key takeaways: While transistors see continuous improvement, wires keep getting worse because of the smaller geometries and larger chip sizes. There are limited ways to avoid such problems, but the biggest impact will come from floorplanning. Analysis today is not adequate. New developments, such as backside power and 3D integration, provide temporary relief but new materials are a d... » read more

A Comparative Study With Horizontal and Verticals FETs (POSTECH, Georgia Tech)


A new technical paper titled "Vertical FET Optimization at Angstrom Nodes: A Comparative Study With Horizontal FET" was published by researchers at POSTECH and Georgia Institute of Technology. Abstract "For the first time, this study presents two novel vertical FET (VFET) structures and conducts a quantitative analysis to assess the competitiveness of VFET in comparison to two types of hori... » read more

Interconnects Approach Tipping Point


As leading devices move to next generation nanosheets for logic, their interconnections are getting squeezed past the point where they can deliver low resistance pathways. The 1nm (10Å) node will have 20nm pitch and larger metal lines, but the interconnect stack already consumes a third of device power and accounts for 75% of the chip's RC delay. Changing this dynamic requires a superior co... » read more

Electromigration And IR Drop At Advanced Nodes


Manufacturing chips at 3nm and below is a challenge, but it's only part of the problem. Designing chips that can be manufactured and will actually work is potentially an even bigger problem. There is more data to sift through for place-and-route, less margin to pad a design, and there are more physical effects to contend with as transistors get taller, density increases, and chips age. Jeff Wil... » read more

Glitch Power Issues Grow At Advanced Nodes


An estimated 20% to 40% of total power is being wasted due to glitch in some of the most advanced and complex chip designs, and at this point there is no single best approach for how and when to address it, and mixed information about how effective those solutions can be. Glitch power is not a new phenomenon. DSP architects and design engineers are well-versed in the power wasted by long, sl... » read more

The Touch-Sensing HMI In Wearable And IoT Devices


The touch-sensing human-machine interface (HMI) in wearable devices is a key element of their consumer appeal, providing a responsive, intuitive way to interact via touch buttons and sliders in devices such as earbuds and smart glasses, or via a small touchscreen in a smart watch. Competition in the market for these types of wearable device continually drives innovation. Manufacturers battle fo... » read more

TSMC Targets N2 Production For 2025


April ended with TSMC’s financial results for the 1st Quarter of 2023 reported on April 20, 2023, and their North American Technology Symposium was held on April 27 at the Santa Clara Convention Center. TSMC’s N3 entered volume production in 4Q 2022 and TSMC’s N2 “nanosheet” technology is on schedule for production in 2025. TSMC’s CEO, C.C. Wei, said during the 1Q conference cal... » read more

Will Monolithic 3D DRAM Happen?


As DRAM scaling slows, the industry will need to look for other ways to keep pushing for more and cheaper bits of memory. The most common way of escaping the limits of planar scaling is to add the third dimension to the architecture. There are two ways to accomplish that. One is in a package, which is already happening. The second is to sale the die into the Z axis, which which has been a to... » read more

Impact Of GAA Transistors At 3/2nm


The chip industry is poised for another change in transistor structure as gate-all-around (GAA) FETs replace finFETs at 3nm and below, creating a new set of challenges for design teams that will need to be fully understood and addressed. GAA FETs are considered an evolutionary step from finFETs, but the impact on design flows and tools is still expected to be significant. GAA FETs will offer... » read more

Slower Metal Bogs Down SoC Performance


Metal interconnect delays are rising, offsetting some of the gains from faster transistors at each successive process node. Older architectures were born in a time when compute time was the limiter. But with interconnects increasingly viewed as the limiter on advanced nodes, there’s an opportunity to rethink how we build systems-on-chips (SoCs). ”Interconnect delay is a fundamental tr... » read more

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