tag: CDC

Week In Review: Design, Low Power
By Jesse Allen - 26 Jul, 2019 - Comments: 0

CEVA acquired the Hillcrest Labs business from InterDigital. Hillcrest Labs supplies software and components for sensor processing in consumer and IoT devices. Hillcrest Labs' MotionEngine sensor processing software already runs on CEVA DSPs (as well as ARM and RISC-V cores) and enables high accuracy 6-axis and 9-axis sensor fusion, dynamic sensor calibration, and application specific features ... » read more

FPGA And System Designs Get To Market Faster Leveraging ASIC-Proven Analysis Tools
By Chris Giles - 30 May, 2019 - Comments: 0

Increasing power constraints have resulted in finer-grained partitioning of designs into functional domains that can have clocks disabled or, more drastically, are powered down entirely. Systems are required to adaptively manage clocks to minimize switching power. Performance and area constraints have led to the abandonment of more conservative practices in favor of more aggressive designs; ... » read more

So Many Waivers Hiding Issues
By Brian Bailey - 05 Oct, 2018 - Comments: 0

Semiconductor Engineering sat down to discuss problems associated with domain crossings with Alex Gnusin, design verification technologist for Aldec; Pete Hardee, director, product management for Cadence; Joe Hupcey, product manager and verification product technologist for Mentor, a Siemens Business; Sven Beyer, product manager design verification for OneSpin; and Godwin Maben, applications en... » read more

Domain Crossing Nightmares
By Brian Bailey - 27 Sep, 2018 - Comments: 1

Semiconductor Engineering sat down to discuss problems associated with domain crossings with Alex Gnusin, design verification technologist for Aldec; Pete Hardee, director, product management for Cadence; Joe Hupcey, product manager and verification product technologist for Mentor, a Siemens Business; Sven Beyer, product manager design verification for OneSpin; and Godwin Maben, applications en... » read more

UPF-Aware Clock-Domain Crossing
By Ed Sperling - 29 Aug, 2018 - Comments: 0

Synopsys’ Namit Gupta talks with Semiconductor Engineering about low-power design techniques at the most advanced process nodes, including how to verify the impact of CDC on power at the register transfer level, how to avoid bugs caused by the post-RTL insertion of low-power devices such as isolation, retention and level shifters. https://youtu.be/HwRe9DHLfmg » read more

Debug Issues Grow At New Nodes
By Ann Mutschler - 26 Jul, 2018 - Comments: 0

Debugging and testing chips is becoming more time-consuming, more complicated, and significantly more difficult at advanced nodes as well as in advanced packages. The main problem is that there are so many puzzle pieces, and so many different use cases and demands on those pieces, that it's difficult to keep track of all the changes and potential interactions. Some blocks are "on" sometimes,... » read more

Raising The Bar On Flat CDC Verification With Hierarchical Data Models
By Ashish Hari - 28 Jun, 2018 - Comments: 0

By Ashish Hari, Aditya Vij, and Ping Yeung Traditionally, clock domain crossing (CDC) verification at the SoC level has relied on flat simulation runs. But flat CDC verification has run out of gas. Largely because of the increase in the number of asynchronous clocks in larger, faster, more complex designs. Flat CDC runs are too performance intensive, time-consuming, and result in high noise.... » read more

Manufacturing Bits: June 6
By Mark LaPedus - 06 Jun, 2017 - Comments: 0

Molecular black holes A group of researchers have used an ultra-bright pulse of X-ray light to hit a tiny atom in a molecule, causing the structure to explode and create a “molecular black hole.” The molecular black hole is different than a black hole in space, however. A black hole is a region in space, which has a gravitational field so strong that no matter or light can escape it. ... » read more

Better Code With RTL Linting And CDC Verification
By Sergei Zaychenko - 23 Feb, 2017 - Comments: 0

Automated design rule checking, or linting, has been around in RTL verification for at least a couple decades, yet still many HDL designers completely ignore this simple yet very powerful bug hunting method. Why would a busy designer need to run this annoying warning generator? The hostility against using conventional linting tools is often explained by the enormous amount of output noise, limi... » read more

Powerful New Standard
By Brian Bailey - 02 Mar, 2016 - Comments: 1

In December 2015, the IEEE released the latest version of the 1801 specification, titled the IEEE standard for design and verification of low-power integrated circuits, but most people know it as UPF or the Unified Power Format. The standard provides a way to specify the power intent associated with a design. With it, a designer can define the various power states of the design and the contexts... » read more

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