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Process Variation Analysis Of Device Performance Using Virtual Fabrication — Methodology Demonstrated On A CMOS 14-nm FinFET Vehicle


A new methodology is demonstrated to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. A model of a FinFET device was built using virtual device fabrication and testing. The model was subsequently calibrated on Design of Experiment corner case data that had been collected on a limited number of processed fab wafers. W... » read more

Zeno Semi Expands On-Chip Memory


San Jose, Calif.-based startup Zeno Semiconductor is testing modifications and a smaller process node for the single-transistor 28nm SRAM chip it introduced in 2016, which could boost space for on-chip CPU memory by more than 2.5X, according to the co-founder and CEO of the company, Yuniarto Widjaja. The Zeno-1 transistor is built on standard CMOS processes, has a bi-stable bipolar transisto... » read more

Transistor Options Narrow For 7nm


Chipmakers are currently ramping up silicon-based finFETs at the 16nm/14nm node, with plans to scale the same technology to 10nm. Now, the industry is focusing on the transistor options for 7nm and beyond. At one time, the leading contenders involved several next-generation transistor types. At present, the industry is narrowing down the options and one technology is taking a surprising lea... » read more