Integrity Problems For Edge Devices


Battery-powered edge devices need to save every picojoule of energy they can, which often means running at very low voltages. This can create signal and power integrity issues normally seen at the very latest technology nodes. But because these tend to be lower-volume, lower-cost devices, developers often cannot afford to perform the same level of analysis on these devices. Noise can come in... » read more

IC Test Solutions For The Automotive Market


The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features, which will increase further with the move towards fully autonomous vehicles. It is critical that these safety-related devices adhere to the highest possible quality and reliability requirements formalized in the ISO 26262 standard that is being rapi... » read more

Visualizing Differences In Analog Design


Prathna Sekar, technical account manager at ClioSoft, explains the challenges of managing analog versus digital IP, including how to deal with dozens or even hundreds of versions of a schematic, and why visualization is so important for identifying changes and updates to an analog design. » read more

Implementing A Multi-Domain System


IoT systems are multi-domain designs that often require AMS, Digital, RF, photonics and MEMS elements within the system. Tanner EDA provides an integrated, top-down design flow for IoT design that supports all these design domains. Learn more about key solutions that the Tanner design flow offers for successful IoT system design and verification. To read more, click here. » read more

Aspinity’s Analog Neural Net Wake-Up Call


Putting an analog chip in front of an always-on system for digitizing speech and having the analog chip listen for sounds of interest may help avoid huge power waste and data congestion in current voice-recognition systems. Aspinity, an analog neuromorphic semiconductor startup, has worked the problem and just announced its Reconfigurable Analog Modular Processor (RAMP) platform yesterday. RAMP... » read more

Why Analog Designs Fail


The gap between analog and digital reliability is growing, and digital designs appear to be winning. Reports show that analog content causes the most test failures and contributes significantly more than digital to field returns. The causes aren't always obvious, though. Some of it is due to the maturity of analog design and verification. While great strides have been made in digital circuit... » read more

Low Power At The Edge


The tech world has come to the realization in recent months that there is far too much data to process everything in the cloud. Now it is starting to come to grips with what that really means for edge and near-edge computing. There still are no rules for where or how that data will be parsed, but there is a growing recognition that some level of pre-processing will be necessary, and that in tur... » read more

Collaborative IC Design Mandates Integrated Data Management


Due to complexity and multi-domain expertise, custom IC design typically requires a team to successfully design and verify the project. Often, specific blocks are assigned to team members based on analog, digital, MEMS, RF expertise, across multiple geographies, and separate verification team members focus on block and system validation. This means that unstructured design files with multiple c... » read more

Lab-To-Fab Testing


Test equipment vendors are working on integrating testing and simulation in the lab with testing done later in the fab, setting the stage for what potentially could be the most significant change in semiconductor test in years. If they are successful, this could greatly simplify design for test, which has become increasingly difficult as chips get more complex, denser, and as more heterogene... » read more

High-Speed SerDes At 7nm


eSilicon’s David Axelrad discusses the challenges with 56Gbps and 112Gps SerDes, and why the switch from analog to digital is required for performance and low power. https://youtu.be/E-CU8TLvjjc » read more

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