tag: electromigration

7nm Design Success Starts With Multi-Domain Multi-Physics Analysis
By Arvind Vel - 28 Nov, 2016 - Comments: 1

Companies can benefit from advancements in the latest semiconductor process technology by delivering smaller, faster and lower power products, especially for those servicing mobile, high performance computing and automotive ADAS applications. By using 7nm processes, design teams are able to add a lot more functionality onto a single chip and lower the power consumption by scaling operating volt... » read more

Partitioning For Power
By Ed Sperling - 14 Nov, 2016 - Comments: 0

Examine any smartphone design today and most of the electronic circuitry is "off" most of the time. And regardless of how many processor cores are available, it's rare to use more than a couple of those cores at any point in time. The emphasis is shifting, though, as the mobility market flattens and other markets such as driver-assisted vehicles and IoT begin gaining traction. In a car, turn... » read more

Toward Real-World Power Analysis
By Brian Bailey - 10 Nov, 2016 - Comments: 0

The expansion of emulation into new fields, rather than just functional verification, is making it possible to do power analysis over longer spans of time. The result is a fast and effective way to analyze real-world scenarios. This is a new field, and it marks a new use of this technology. While it is still evolving, several ideas have surfaced about the best methodology and the best way to... » read more

Closing The Power Integrity Gap
By Ann Mutschler - 19 Oct, 2016 - Comments: 0

Voltage drop has always been a significant challenge. As far back as 130nm, specialist tools were being used to ensure that enough local decoupling capacitance (decap) cells were inserted in addition to larger decaps implemented around the SoC. But advanced nodes are complicating matters and further increasing complexity. These technological challenges, which underlie the power, performance ... » read more

Why Do You Need Chip-Package-System Co-Design And Co-Analysis?
By Youngsoo Lee - 13 Oct, 2016 - Comments: 0

Whether it is the need for sustainable energy, or driving performance while keeping power at bay, or enabling safe and reliable operation of any electronic system, containment of electronic noise — power and signal noise is critical to all of the above. Other factors that impact safe and reliable operation are electromigration (EM), electromagnetic interference (EMI) and mechanical stress ena... » read more

Noise Killed My Chip
By Brian Bailey - 08 Sep, 2016 - Comments: 0

In the past, noise was considered an annoyance, especially for analog circuitry. But today chips are actually failing because insufficient analysis was performed. Noise types that used to be second-order effects are becoming primary factors that have to be considered. This is happening at the same time that noise margins are getting smaller, both in the amplitude and temporal dimensions. It ... » read more

Designing SoC Power Networks
By Brian Bailey - 11 Aug, 2016 - Comments: 0

Designing a power network for a complex SoC is becoming critical for the success of the product, but most chips are still using old techniques that are ill-suited to the latest fabrication technologies, resulting in an expensive, overdesigned product. Not only is the power network as designed too large, but this has several knock-on effects that impact area, timing and power. In the first pa... » read more

SoC Power Grid Challenges
By Brian Bailey - 14 Jul, 2016 - Comments: 7

The consumption of power and dissipation of heat within large SoCs has received a lot of attention recently, but that is only part of the issue. Power also has to be reliably delivered onto and around the system. This is becoming increasingly difficult, and new nodes are adding to the list of challenges. "If we were building chips where there was only a single Vdd and Vss then it is not that... » read more

TSVs: Copper, Silicon, And CTE Mismatch
By Katherine Derbyshire - 23 Jun, 2016 - Comments: 3

As previous articles in this series have discussed, advanced packages introduce new materials and new reliability concerns. Diffusion into solder bumps can create brittle, high resistance, intermetallic compounds. Heat transfer through an interposer can degrade the lifetime of even cool, low power chips. Still, through-silicon vias are unique in that they cut directly through the integrated cir... » read more

Electromigration: Not Just Copper Anymore
By Katherine Derbyshire - 31 May, 2016 - Comments: 2

While integrated circuit manufacturers have worried about electromigration for a long time, until recently most of their concerns have focused on the on-chip interconnects. The larger dimensions found in integrated circuit packages have, in most cases, improved heat dissipation, reduced current density, and eliminated most [getkc id="160" kc_name="electromigration"] risks. Over the last sev... » read more

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