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Best Practices For Efficient And Effective Planar EM Simulation


Designers of today’s complex, multi-featured communications products require accurate and fast electromagnetic (EM) simulation to deliver cost-effective, high-performance products to market in ever-shrinking windows of opportunity. The Cadence AWR AXIEM 3D planar method-of-moments (MoM) EM analysis simulator within the AWR software portfolio delivers the accuracy, capacity, and speed designer... » read more

Faster Than Moore’s Law: Exponential Innovation In Electromagnetic Simulation


Moore’s Law is the most iconic statement of exponential technology advancement, doubling transistor count and hence functional performance every 24 months. Many pundits [1-3] have observed that while technology advancement is exponential, human expectations are linear. We often fail to anticipate when a technology may arrive in short order. Electromagnetic simulation has delivered exponential... » read more

EUV Reticle Print Verification With Advanced Broadband Optical Wafer Inspection And e-Beam Review Systems


As the Extreme Ultraviolet (EUV) lithography ecosystem is being actively mapped out to enable sub-7nm design rule devices, there is an immediate and imperative need to identify the EUV reticle (mask) inspection methodologies. The introduction of additional particle sources due to the vacuum system and potential growth of haze defects or other film or particle depositions on the reticle, in comb... » read more