Verifying Safety-Critical FPGA Designs With Fault Simulation

By Synopsys - 12 Jan, 2021 - Comments: 0

Supporting safety and assurance in designs, such as the chips used in industrial, aerospace and defense applications, requires more than traditional functional verification. Even if every bug is found and fixed before release, these applications have additional requirements for functional safety. They must be able to handle a variety of faults and induced errors, either by correcting them or by... » read more

Automation And Fault Simulation Of Safety-Critical FPGA Designs

By Joe Mallett - 15 Dec, 2020 - Comments: 0

Functional safety is a major challenge for field programmable gate arrays (FPGAs) and other semiconductor designs. Safety requirements go beyond traditional verification, which focuses on design bugs. Chips in safety-critical applications must be able to handle a variety of faults from sources such as temperature and power extremes, device aging, radiation, ionization and component failures. Ap... » read more

Improving Test Coverage And Eliminating Test Ecapes Using Analog Defect Analysis

By Cadence - 06 May, 2020 - Comments: 0

While the analog and mixed-signal components are the leading source of test escapes that result in field failures, the lack of tools to analyze the test coverage during design has made it difficult for designers to address the issue. In this white paper, we explore the methodology for performing analog fault simulation of test coverage based on defect-oriented testing. In addition, we look at h... » read more

Verification Of Functional Safety (Part 2)

By Brian Bailey - 22 Feb, 2018 - Comments: 0

The automotive industry is grappling with a tradeoff between cost and safety. Safety is well understood in industries that are cost-insensitive, such as aerospace and medical, and the consumer industry has a long track record of driving down costs while increasing functionality. But can these two industries be brought together in a safe and effective manner to enable automobiles to achieve the ... » read more

Safety Plus Security: A New Challenge

By Brian Bailey - 08 Jun, 2017 - Comments: 0

Nobody has ever integrated safety or security features into their design just because they felt like it. Usually, successive high-profile attacks are needed to even get an industry's attention. And after that, it's not always clear how to best implement solutions or what the tradeoffs are between cost, performance, and risk versus benefit. Putting safety and security in the same basket is a ... » read more

Fault Simulation Reborn

By Brian Bailey - 23 Feb, 2017 - Comments: 0

Fault simulation, one of the oldest tools in the EDA industry toolbox, is receiving a serious facelift after it almost faded from existence. In the early days, fault simulation was used to grade the quality of manufacturing test vectors. That task was replaced almost entirely by [getkc id="173" comment="scan test"] and automatic test pattern generation (ATPG). Today, functional safety is cau... » read more

Analog Fault Simulation Challenges And Solutions

By Mentor, a Siemens Business - 28 Sep, 2016 - Comments: 0

The test time for digital circuit blocks in ICs has greatly decreased in the last 20 years, thanks to scan-based design-for-test (DFT), automatic test pattern generation (ATPG) tools, and scan compression. These technologies have greatly reduced the number of test vectors applied by automatic test equipment (ATE) while maximizing the coverage of a wide range of defect types. But for analog c... » read more

Time To Pay The Piper

By Brian Bailey - 28 Jul, 2016 - Comments: 3

The Pied Piper of Hamelin is a German fable about a rat catcher who used his magic pipe to lure away rats. When he was not paid by the town, he used his pipe to lure away all of the town's children. I am not suggesting that exactly the same is true for the semiconductor industry and having not paid [getkc id="7" kc_name="EDA"], but I do not think they have paid enough and they will now have to ... » read more

Knowledge Centers
Entities, people and technologies explored

Shift Left Is The Tip Of The Iceberg

A transformative change is underway for semiconductor design and EDA. New languages, models, and abstractions will need to be created.

by Brian Bailey

Partitioning In The Chiplet Era

Understanding how chiplets interact under different workloads is critical to ensuring signal integrity and optimal performance in heterogeneous designs.

by Ann Mutschler

NAND Flash Targets 1,000 Layers

New techniques go beyond improved deposition and etching, but challenges stack up, too.

by Bryon Moyer

3.5D: The Great Compromise

Pros and cons of a middle-ground chiplet assembly that combines 2.5D and 3D-IC.

by Ed Sperling

AI’s Role In Chip Design Widens, Drawing In New Startups

Focus is on letting engineers do much more with the same or fewer resources — and less drudgery.

by Karen Heyman

What Comes After HBM For Chiplets

The standard for high-bandwidth memory limits design freedom at many levels, but that is required for interoperability. What freedoms can be taken from other functions to make chiplets possible?

by Brian Bailey

Memory Fundamentals For Engineers

eBook: Nearly everything you need to know about memory, including detailed explanations of the different types of memory; how and where these are used today; what's changing, which memories are successful and which ones might be in the future; and the limitations of each memory type.

by The SE Staff

Why Small Fab And Assembly Houses Are Thriving

Megafabs churning out the most advanced processors are not the only game in town.