AI Process Control Platform Enabling Next Generation Technology

By Tignis - 16 Aug, 2023 - Comments: 0

PAICe Monitor delivers AI and machine learning-enabled analytics for all stages of the semiconductor fabrication process lifecycle — from process development and ramp readiness, to high volume production. Leveraging Tignis’ Digital Twin Query Language, PAICe Monitor enables process engineers to transform in-product fault diagnoses into continuous real-time monitoring—greatly improving ... » read more

Maintaining Vehicles Of The Future

By proteanTecs - 08 Feb, 2023 - Comments: 0

Driving a scalable, consumer-centric vision in the mobility industry, vehicles of thefuture will always be connected and differentiated by software. Advancements in software, hardware and their interaction are expanding the boundaries of performance, providing the foundation for next-generation cars. But the same technology that will make this vision a reality also presents new challenges. O... » read more

Similar But Different — The Tale Of Transient And Permanent Faults

By Siemens EDA - 05 Oct, 2022 - Comments: 0

When determining whether an IC is safe from random hardware faults, applying safety metrics such as PMHF, SPFM, and LFM, engineers must analyze both transient and permanent faults. This paper highlights the fundamental differences between permanent and transient faults on digital circuits, and why this distinction is important in the context of the ISO 26262:2018 functional safety standard. ... » read more

Orchestrating An Efficient ISO 26262 Fault Campaign

By Siemens EDA - 02 Jun, 2021 - Comments: 0

The primary objective of a fault campaign is to understand whether the safety architecture sufficiently prevents random failures from violating ISO 26262 safety requirements for both commercial and passenger automobiles. To complete fault injection, faults are injected and propagated in the design to validate the functional correctness of the safety mechanisms and to classify each fault. Fault ... » read more

Automation And Fault Simulation Of Safety-Critical FPGA Designs

By Joe Mallett - 15 Dec, 2020 - Comments: 0

Functional safety is a major challenge for field programmable gate arrays (FPGAs) and other semiconductor designs. Safety requirements go beyond traditional verification, which focuses on design bugs. Chips in safety-critical applications must be able to handle a variety of faults from sources such as temperature and power extremes, device aging, radiation, ionization and component failures. Ap... » read more

Knowledge Centers
Entities, people and technologies explored

Shift Left Is The Tip Of The Iceberg

A transformative change is underway for semiconductor design and EDA. New languages, models, and abstractions will need to be created.

by Brian Bailey

Partitioning In The Chiplet Era

Understanding how chiplets interact under different workloads is critical to ensuring signal integrity and optimal performance in heterogeneous designs.

by Ann Mutschler

3.5D: The Great Compromise

Pros and cons of a middle-ground chiplet assembly that combines 2.5D and 3D-IC.

by Ed Sperling

AI’s Role In Chip Design Widens, Drawing In New Startups

Focus is on letting engineers do much more with the same or fewer resources — and less drudgery.

by Karen Heyman

Key Technologies To Extend EUV To 14 Angstroms

Alongside high-NA EUV will be better-performing photoresists, reduced roughness using passivation and etch, and lateral etching to reduce tip-to-tip dimensions.

by Laura Peters

Memory Fundamentals For Engineers

eBook: Nearly everything you need to know about memory, including detailed explanations of the different types of memory; how and where these are used today; what's changing, which memories are successful and which ones might be in the future; and the limitations of each memory type.

by The SE Staff

What Comes After HBM For Chiplets

The standard for high-bandwidth memory limits design freedom at many levels, but that is required for interoperability. What freedoms can be taken from other functions to make chiplets possible?

by Brian Bailey

Why Small Fab And Assembly Houses Are Thriving

Megafabs churning out the most advanced processors are not the only game in town.

by Bryon Moyer

tag: faults

AI Process Control Platform Enabling Next Generation Technology

Maintaining Vehicles Of The Future

Similar But Different — The Tale Of Transient And Permanent Faults

Orchestrating An Efficient ISO 26262 Fault Campaign

Automation And Fault Simulation Of Safety-Critical FPGA Designs