tag: Fraunhofer IIS EAS

From Constraints To Tape-Out: Towards A Continuous AMS Design Flow
By Fraunhofer IIS/EAS - 12 Jun, 2019 - Comments: 0

The effort in designing analog/mixed-signal (AMS) integrated circuits is characterized by the largely manual work involved in the design of analog cells and their integration into the overall circuit. This inequality in effort between analog and digital cells increases with the use of modern, more complex technology nodes. To mitigate this problem, this paper presents four methods to improve ex... » read more

Optimization Challenges For Safety And Security
By Brian Bailey - 11 Apr, 2019 - Comments: 0

Complexity challenges long-held assumptions. In the past, the semiconductor industry thought it understood performance/area tradeoffs, but over time it became clear this is not so simple. Measuring performance is no longer an absolute. Power has many dimensions including peak, average, total energy and heat, and power and function are tied together. Design teams are now dealing with the impl... » read more

Toward Consistent Circuit-Level Aging Simulations In Different EDA Environments
By Fraunhofer IIS/EAS - 10 Apr, 2019 - Comments: 0

Aging simulations on circuit level allow integrated circuit (IC) designers to verify their circuits with respect to lifetime reliability requirements by considering the degradation of field effect transistors (FETs). To obtain significant analysis results with a reasonable effort, two prerequisites have to be fulfilled. First, reasonable models for FET degradation effects have to be set up. Sec... » read more

Digital Twins Deciphered
By Brian Bailey - 28 Mar, 2019 - Comments: 0

Ever since Siemens acquired Mentor Graphics in 2016, a new phrase has become more common in the semiconductor industry – the digital twin. Exactly what that is, and what impact it will have on the semiconductor industry, is less clear. In fact, many in the industry are scratching their heads over the term. The initial reaction is that the industry has been creating what are now termed digi... » read more

Why Analog Designs Fail
By Brian Bailey - 14 Feb, 2019 - Comments: 2

The gap between analog and digital reliability is growing, and digital designs appear to be winning. Reports show that analog content causes the most test failures and contributes significantly more than digital to field returns. The causes aren't always obvious, though. Some of it is due to the maturity of analog design and verification. While great strides have been made in digital circuit... » read more

Pushing AI Into The Mainstream
By Brian Bailey - 31 Jan, 2019 - Comments: 0

Artificial intelligence is emerging as the driving force behind many advancements in technology, even though the industry has merely scratched the surface of what may be possible. But how deeply AI penetrates different market segments and technologies, and how quickly it pushes into the mainstream, depend on a variety of issues that still must be resolved. In addition to a plethora of techni... » read more

Process Variation And Aging
By Ann Mutschler - 17 Jan, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss design reliability and circuit aging with João Geada, chief technologist for the semiconductor business unit at ANSYS; Hany Elhak, product management director, simulation and characterization in the custom IC and PCB group at Cadence; Christoph Sohrmann, advanced physical verification at Fraunhofer EAS; and Naseer Khan, vice president of sales at M... » read more

Chasing Reliability In Automotive Electronics
By Susan Rambo And Ed Sperling - 15 Jan, 2019 - Comments: 0

Assuring reliability in automotive electronics has set off a scramble across the semiconductor supply chain and unearthed a list of issues for which there is insufficient data, a lack of well-defined standards, and inconsistent levels of expertise. Reliable functional safety that spans 18 to 20 years of service in harsh environments, or under constant use with autonomous taxis or trucks, is ... » read more

Making Autonomous Vehicles Safer
By Kevin Fogarty - 10 Jan, 2019 - Comments: 2

While self-driving vehicles are beta-tested on some public roads in real traffic situations, the semiconductor and automotive industries are still getting a grip on how to test and verify that vehicle electronics systems work as expected. Testing can be high stakes, especially when done in public. Some of the predictions about how humans will interact with autonomous vehicles (AVs) on public... » read more

AI Market Ramps Everywhere
By Brian Bailey - 20 Dec, 2018 - Comments: 0

Artificial Intelligence (AI) has inspired the general populace, but its rapid rise over the past few years has given many people pause. From realistic concerns about robots taking over jobs to sci-fi scares about robots more intelligent than humans building ever smarter robots themselves, AI inspires plenty of angst. Within the technology industry, we have a better understanding about the pote... » read more

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