HEVC Codec Analysis: Exploring the Parallelization Features of SLX


This white paper details the results of running the parallelization features of SLX to quickly explore the HHI/ Fraunhofer reference HEVC codec implementation. The codec allows developers to make trade-offs of coding efficiency versus effective use of the parallel computation resources of the target platform. SLX is primarily used to assess the benefits of any exposed parallelism in the curr... » read more

Chasing Reliability In Automotive Electronics


Assuring reliability in automotive electronics has set off a scramble across the semiconductor supply chain and unearthed a list of issues for which there is insufficient data, a lack of well-defined standards, and inconsistent levels of expertise. Reliable functional safety that spans 18 to 20 years of service in harsh environments, or under constant use with autonomous taxis or trucks, is ... » read more

Making Autonomous Vehicles Safer


While self-driving vehicles are beta-tested on some public roads in real traffic situations, the semiconductor and automotive industries are still getting a grip on how to test and verify that vehicle electronics systems work as expected. Testing can be high stakes, especially when done in public. Some of the predictions about how humans will interact with autonomous vehicles (AVs) on public... » read more

Taming NBTI To Improve Device Reliability


Negative-bias temperature instability is a growing issue at the most advanced process nodes, but it also has proven extremely difficult to tame using conventional approaches. That finally may be starting to change. NBTI is an aging mechanism in field-effect transistors that leads to a change of the characteristic curves of a transistor during operation. The result can be a drift toward unint... » read more

Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh Environments


On the example of a 28nm SRAM array, this work presents a novel reliability study which takes into account the effect of externally applied mechanical stress in circuit simulations. This method is able to predict the bit failures caused by the stress via the piezoresistive effect. The stability of each single SRAM cell is simulated using static noise margin. Finally, the whole array’s behavio... » read more

Manufacturing Bits: Oct. 2


Quantum satellites The Fraunhofer Institute for Applied Optics and Precision Engineering has developed a critical technology to enable quantum satellites. Fraunhofer has developed a quantum source, which would be used in satellites. In theory, the source generates entangled photons and transmits them to Earth from a satellite. They would serve to distribute secure keys for encrypting data. ... » read more

Memory Startups To Watch


The next-generation memories are finally ramping up after years’ of delays and promises. Intel, for one, is shipping 3D XPoint, a next-generation technology based on phase-change memory. In addition, the big foundries are readying embedded MRAM. And, of course, there are a number of other players in the next-generation memory arena. There are also a number of startups that are flying un... » read more

Predictive Maintenance In Tomorrow’s Industries


By Olaf Enge-Rosenblatt and Steven Brandt Tomorrow’s production plants must be efficient and adaptive, which is the key to survival in modern, highly competitive markets brought about by digitalization and automation. Future-oriented companies are increasingly focusing on a tight combination of automation and computer technology as promised by the Industry 4.0 paradigm. More and more globa... » read more

Leti’s Next Focus


Emmanuel Sabonnadière, chief executive of Leti, sat down with Semiconductor Engineering to discuss R&D trends, a new deal with Soitec, and the latest developments at the France-based research organization. Leti is a research institute of CEA Tech. What follows are excerpts of that conversation. SE: Leti recently formed an alliance with Soitec. Under the terms, Leti and Soitec are formin... » read more

5nm Design Progress


Activity surrounding the 5nm manufacturing process node is quickly ramping, creating a better picture of the myriad and increasingly complex design issues that must be overcome. Progress at each new node after 28nm has required an increasingly tight partnership between the foundries, which are developing new processes and rule decks, along with EDA and IP vendors, which are adding tools, met... » read more

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