AI Framework Maps Thermal Behavior In 3D Photonic Circuits (U. of Florida et al.)


Researchers from University of Florida, ficonTEC Service, and Colorado State University published a technical paper titled “AI-Driven Thermal Mapping and Management in 3D Integrated Photonic Circuits.” Abstract Excerpt: “Photonic Integrated Circuits (PICs) are advancing high-performance computing, data centers, and sensing, yet three-dimensional (3D) PICs introduce critical thermal man... » read more

When The Test Cell Lies


Key Takeaways:   A marginal test result can be electrically valid and still diagnostically misleading because the socket, load board, and thermal loop are now part of the measurement.   Separating device drift from test-cell drift depends on tracking margins, variance, and calibration trends rather than bins alone.   In advanced packages, a false pass destroys value downstream, ... » read more

Realizing The Future Of 3D-IC Design


The integration of heterogeneous chiplet technology has fundamentally transformed semiconductor design, enabling the efficient creation of sophisticated system-in-packages by assembling pre-designed or third-party IP onto high-performance interposers and advanced packages. This approach offers significant advantages over traditional monolithic designs, including enhanced performance, improved p... » read more

Side-Channel Risks Across 2.5D/3D Integration and Chiplet-Based Systems (Grenoble INP – UGA et al.)


Researchers from Grenoble INP - UGA, CNRS, TIMA have released “Spying Across Chiplets: Side-Channel Attacks in 2.5/3D Integrated Systems”. Abstract “Advanced packaging and chiplet-based integration are increasingly adopted to build complex heterogeneous systems beyond the limits of monolithic scaling. While these architectures offer major benefits in terms of modularity, yield, a... » read more

Advancing Heterogeneous Integration Through Industry Roadmap Improvements


Heterogeneous integration requires comprehensive roadmaps to support collaboration across the design and manufacturing of the next generation of semiconductor products and the systems they support. A global team of researchers from a broad spectrum of industry, academia, and research institutes led by Intel has published a perspective in the March 2026 issue of Nature Reviews Electrical Enginee... » read more

Micro-Transfer Printing (MTP) As A Promising Scalable Approach to Heterogeneous Integration for Silicon Photonics (Ghent U., imec et al)


A new technical paper, "Micro-Transfer Printing on Silicon Photonics: Tutorial, Recent Progress and Outlook," was published by researchers at Ghent University, imec et al. Abstract "This paper highlights micro-transfer printing (MTP) as a promising scalable approach to heterogeneous integration for silicon photonics. MTP uniquely achieves high integration density, high throughput, and hig... » read more

Home Win: Challenging The Traditional Semiconductor Manufacturing Model


Across Europe, many of us have grown accustomed to a model where semiconductor products, subassemblies and components are sourced from the Far East almost by default. The rationale has always been clear: significantly lower labor and manufacturing costs made offshore supply the most commercially viable option. Yet, while this approach has long been convenient, it has never been without compromi... » read more

2.5D + 3D = “3.5D”!


The semiconductor industry is no longer defined solely by transistor scaling. As Moore's law decelerates, advanced packaging has become the primary lever for achieving system-level performance gains. Within this landscape, the equation 2.5D + 3D = 3.5D—defying the instincts of basic math and physics—captures a pivotal architectural evolution: one that balances performance, manufacturabilit... » read more

Rethinking ESD Protection for System-On-Integrated Chiplets (UC Riverside)


A new technical paper, "In-SoIC ESD Protection for Chiplet-Based 3D Microsystems: Future Research Directions," was published by researchers at the University of California, Riverside. Abstract "Heterogeneous integration opens a pathway to three-dimensional chiplet-based microsystem chips. Electrostatic discharge reliability is a major challenge to future smart chips featuring rich functio... » read more

When Semiconductor Materials Misbehave


Key Takeaways Material behavior in production depends on the process context that no development environment can fully replicate. In advanced packaging, the interactions that cross domain boundaries are increasingly where failures originate. The most accurate materials data is also the most commercially sensitive, leaving simulation models calibrated against generic inputs rather tha... » read more

← Older posts