Improving In-System Test With Tessent VersaPoint Test Point Technology


This paper describes a new versatile test point technology called VersaPoint, which has been developed specifically to work with designs implementing mixed EDT/LBIST methodologies to reduce EDT pattern counts and improve Logic BIST (LBIST) test coverage. VersaPoint test points can reduce compressed pattern counts 2X to 4X beyond compression alone and improve LBIST test coverage beyond what is p... » read more

Planning Ahead For In-System Test Of Automotive ICs


Automobiles are increasingly more like electronic devices than mechanical platforms. As a share of the total cost of a car, electronics components have grown from about 5% in 1970 to 35% in 2010. Electronics are projected to account for 50% by 2030 (Deloitte, 2019). Some of the electronics are for passive operations, like display or In-Vehicle Infotainment (IVI) systems, but a growing proportio... » read more

A Simple Way To Improve Automotive In-System Test


The remarkable growth in automotive IC design has prompted a focus on ISO26262 functional safety compliance, which includes both high-quality manufacturing test and a minimum stuck-at test coverage of 90% for in-system test. Designers must also control IC test data volumes, test application times, and test costs. A new test point technology that improves in-system test coverage and reduces patt... » read more