Creating chips that can be tested throughout their expected lifetimes.
As design pushes deeper into data-driven architectures, so does test. Geir Eide, director for product management of DFT and Tessent Silicon Lifecycle Solutions at Siemens Digital Industries Software, talks with Semiconductor Engineering about a subtle but significant shift for designing testability into chips so that test data can be used at multiple stages during a device’s lifetime.
Disaggregation and the wind-down of Moore’s Law have changed everything.
Different interconnect standards and packaging options being readied for mass chiplet adoption.
Continued expansion in new and existing markets points to massive and sustained growth.
Aging equipment and rising demand are pushing up prices and slowing production.
Experts at the Table: Designing for context, and geopolitical impacts on a global supply chain.
Interest in this particular ISA is expanding, but the growth of other open-source hardware is less certain.
Nanosheets are likeliest option throughout this decade, with CFETs and other exotic structures possible after that.
Hybrid bonding opens up whole new level of performance in packaging, but it’s not the only improvement.
Why this is becoming a bigger issue, and what can be done to mitigate the effects.
Some 300mm tools are converted to 200mm; equipment prices and chip manufacturing costs are rising.
From low resistance vias to buried power rails, it takes multiple strategies to usher in 2nm chips.
Manufacturing 3D structures will require atomic-level control of what’s removed and what stays on a wafer.
Disaggregation and the wind-down of Moore’s Law have changed everything.
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