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Manufacturing Bits: March 2


Next-gen AFM At the recent SPIE Advanced Lithography conference, Imec, Infinitesima and others described a new metrology tool technology called a Rapid Probe Microscope (RPM). Infinitesima has shipped its first RPM 3D system, enabling three-dimensional (3D) metrology applications for leading-edge chips. The system was jointly developed with Imec. In the IEDM paper, Imec and Infinitesima... » read more

Blog Review: Mar. 11


Rambus' Steven Woo examines how the upcoming deployment of 5G will enable processing at the edge, and how the edge is getting refined further into the near edge and the far edge with a range of AI solutions across it. A Synopsys writer explains the types of Compute Express Link devices and CXL's unique verification challenges like maintaining the cache coherency between a host CPU and an acc... » read more