tag: ISO 26262

Sensors, Data And Machine Learning
By Ed Sperling - 12 May, 2020 - Comments: 0

Strategies for building reliability into chips and systems are beginning to shift as more sensors are added into these devices and machine learning is applied to that data. In the past, system monitoring relied heavily on MEMS devices for things like acceleration, temperature and positioning (gyroscopes). While those devices are still important, in the past couple years there has been an exp... » read more

Sensing Automotive IC Failures
By Anne Meixner - 12 May, 2020 - Comments: 1

The sooner you detect a failure in any electronic system, the sooner you can act. Together, data analytics and on-chip sensors are poised to boost quality in auto chips and add a growing level of predictive maintenance for vehicles. The ballooning number of chips cars makes it difficult to reach 10 defective parts per billion for every IC that goes into a car.  And requiring that for a 15-y... » read more

IC Test Solutions For The Automotive Market
By Mentor, a Siemens Business - 06 May, 2020 - Comments: 0

The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features, which will increase further with the move towards fully autonomous vehicles. It is critical that these safety-related devices adhere to the highest possible quality and reliability requirements formalized in the ISO 26262 standard that is being rapi... » read more

Power-Hungry Safety And Security
By Brian Bailey - 09 Apr, 2020 - Comments: 0

There is a price to pay for everything. When it comes to adding safety and security into a device, the costs in terms of power and area can be significant, but if the task is taken seriously, those costs can be managed and minimized. New analysis and implementation tools are coming to market that can also help to keep the costs contained. But it also requires the right mindset. As more indus... » read more

Reliability Challenges Grow For 5/3nm
By SE Staff - 07 Apr, 2020 - Comments: 0

Ensuring that chips will be reliable at 5nm and 3nm is becoming more difficult due to the introduction of new materials, new transistor structures, and the projected use of these chips in safety- and mission-critical applications. Each of these elements adds its own set of challenges, but they are being compounded by the fact that many of these chips will end up in advanced packages or modul... » read more

The Need For Traceability In Auto Chips
By Anne Meixner - 07 Apr, 2020 - Comments: 4

Someday your car will drive itself to a repair shop for a recall using a scheduling application that is both efficient and can prioritize which vehicles need to be fixed first. But that's still a ways off. Proactive identification of issues is not yet available. To be ready for that, today’s data analytics systems need to begin supporting targeted recalls, enabling predictive maintenance a... » read more

Four Steps To ISO 26262 Safety Mechanism Insertion And Validation
By Ping Yeung - 02 Apr, 2020 - Comments: 1

By Ping Yeung, Jin Hou, Vinayak Desai, and Jacob Wiltgen The complexity of automotive integrated circuits (ICs) has grown exponentially with the introduction of advanced driver-assistance systems and autonomous-drive technologies. Directly correlated to this hike in complexity is the increased burden of ensuring an IC is protected from random hardware faults—functional failures that occur ... » read more

Tracking Automotive’s Rapidly Shifting Ecosystem
By Ann Mutschler - 02 Apr, 2020 - Comments: 0

The automotive ecosystem is becoming much harder to navigate as automakers, Tier 1s and IP vendors redefine their relationships based upon shifting value caused by an rapidly expanding amount of increasingly interdependent and complex electronic content. Predictions of massive change started almost a decade ago with a number of pilot programs around autonomous vehicles. But those shifts real... » read more

Designing Resilient Electronics
By Ann Mutschler - 18 Mar, 2020 - Comments: 0

Electronic systems in automobiles, airplanes and other industrial applications are becoming increasingly sophisticated and complex, required to perform an expanding list of functions while also becoming smaller and lighter. As a result, pressure is growing to design extremely high-performance chips with lower energy consumption and less sensitivity to harsh environmental conditions. If this ... » read more

Improving Functional Safety For ICs
By Mohammed Abdelwahid - 10 Mar, 2020 - Comments: 0

The exponential growth of electronics in automobiles have stimulated significant innovation towards the development of advanced safety mechanisms. In addition to very high-quality manufacturing test, ICs for safety-critical applications need in-system test to detect faults and monitor circuit aging. Scan-based logic built-in-self-test (LBIST) is the technique used for in-system test, but tradit... » read more

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