Chip Industry’s Technical Paper Roundup: Nov. 1


New technical papers added to Semiconductor Engineering’s library this week. [table id=61 /] » read more

In-NAND Flash Processing Technique for Improved Performance, Energy Efficiency & Reliability of Bulk Bitwise Operations


A new technical paper titled "Flash-Cosmos: In-Flash Bulk Bitwise Operations Using Inherent Computation Capability of NAND Flash Memory" was published by researchers at ETH Zurich, POSTECH, LIRMM/Univ. Montpellier/CNRS and Kyungpook National University. Find the technical paper here (published September 2022) and related YouTube lecture here. "We propose Flash-Cosmos (Flash Computation wi... » read more

Chip Industry’s Technical Paper Roundup: Oct 18


New technical papers added to Semiconductor Engineering’s library this week. [table id=57 /] » read more

Accelerating Off-Chip Load Requests By Removing The On-Chip Cache Access Latency From Their Critical Path


A new technical paper titled "Hermes: Accelerating Long-Latency Load Requests via Perceptron-Based Off-Chip Load Prediction" was published by researchers at ETH Zurich, Intel Processor Architecture Research Lab, and LIRMM, Univ. Montpellier, CNRS.  The work received a best paper award at MICRO 2022. Abstract "Long-latency load requests continue to limit the performance of high-performance ... » read more

Technical Paper Roundup: Sept 27


New technical papers added to Semiconductor Engineering’s library this week. [table id=53 /] Semiconductor Engineering is in the process of building this library of research papers. Please send suggestions (via comments section below) for what else you’d like us to incorporate. If you have research papers you are trying to promote, we will review them to see if they are a good fit f... » read more

Radiation-Hardened Non-Volatile Magnetic Latch That Tolerates SNUs and DNUs


A research paper titled "A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage" was published by researchers at Anhui University, Hefei University of Technology, LIRMM, and Kyutech. According to the abstract: "Based on an advanced triple-path dual-interlocked-storage-cell (TPDICE) and MTJs, this paper proposes a radiation-hardened non-volatile magneti... » read more

Technical Paper Round-up: July 11


New technical papers added to Semiconductor Engineering’s library this week. [table id=38 /]   Semiconductor Engineering is in the process of building this library of research papers. Please send suggestions (via comments section below) for what else you’d like us to incorporate. If you have research papers you are trying to promote, we will review them to see if they are a ... » read more

Sibyl, a lightweight, reinforcement learning-based data placement technique for hybrid storage systems (ETH Zurich)


New research paper titled "Sibyl: Adaptive and Extensible Data Placement in Hybrid Storage Systems Using Online Reinforcement Learning" from researchers at ETH Zurich, Eindhoven University of Technology, and LIRMM, Univ. Montpellier, CNRS. Abstract "Hybrid storage systems (HSS) use multiple different storage devices to provide high and scalable storage capacity at high performance. Recent r... » read more

Technical Paper Round-Up: May 24


New technical papers added to Semiconductor Engineering’s library this week.   [table id=29 /] Semiconductor Engineering is in the process of building this library of research papers. Please send suggestions (via comments section below) for what else you’d like us to incorporate. If you have research papers you are trying to promote, we will review them to see if they are a ... » read more

Performing Edge Detection With Oscillatory Neural Networks as a Hetero-associative Memory


New research paper titled "Oscillatory Neural Network as Hetero-Associative Memory for Image Edge Detection" from LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier. Abstract "The increasing amount of data to be processed on edge devices, such as cameras, has motivated Artificial Intelligence (AI) integration at the edge. Typical image processing me... » read more

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