tag: logic BiST

Don’t Let X Be A Problem For Logic BIST
By Rahul Singhal - 12 Oct, 2021 - Comments: 0

By Rahul Singhal and Giri Podichetty A failure in the operation of integrated circuits (ICs) or chips deployed in safety-critical applications such as automotive, medical, and aerospace could have catastrophic consequences. These failures could stem from defects in the chip that escaped manufacturing tests or from transient faults that can occur during system operation due to factors such as... » read more

How To Meet Functional Safety Requirements With Built-In-Self-Test
By Lee Harrison - 04 Jun, 2020 - Comments: 1

With the rapid growth in semiconductor content in today’s vehicles, IC designers need to improve their process of meeting functional safety requirements defined by the ISO 26262 standard. The ISO 26262 standard defines the levels of functional safety, known as Automotive Safety Integrity Level (ASIL), and is a mandatory part of an automotive system design process. The ASIL categories range... » read more

Challenges Of Logic BiST In Automotive ICs
By Mohammed Abdelwahid - 09 Jul, 2019 - Comments: 1

The electronics in passenger cars continues to grow, and much of it is bound by the strict functional safety requirements formalized in the ISO 26262 standard. The ICs that drive the electronics systems in automobiles are also increasingly complex, designed to execute artificial intelligence algorithms that govern emerging self-driving capabilities. Designers are quickly adopting comprehensi... » read more

Meeting ISO 26262 Requirements Using Tessent IC Test Solutions
By Mentor, a Siemens Business - 08 Jul, 2019 - Comments: 0

As the industry moves towards greater automation in vehicles, suppliers of the ICs used to drive the automotive electronic systems are rapidly adopting solutions to meet ISO 26262 requirements. The Tessent family of IC test products offers the highest defect coverage, in-system non-destructive memory test, hybrid ATPG/Logic BIST, and analog test coverage measurement. These technologies add up t... » read more

How Automotive ICs Are Reshaping Semiconductor Test
By Steve Pateras - 22 Mar, 2018 - Comments: 0

The growth of a new IC market creates ripples along the entire supply chain. Today, we see the semiconductor industry reacting to the needs of the growing automotive IC market, including the development of new IC test tools and methods. The automotive IC market is far and away the fastest growing end-use market with 15% CAGR (according to IC Insights). It is also seeing many new players. Mar... » read more

Improving In-System Test With Tessent VersaPoint Test Point Technology
By Mentor, a Siemens Business - 10 Jan, 2018 - Comments: 0

This paper describes a new versatile test point technology called VersaPoint, which has been developed specifically to work with designs implementing mixed EDT/LBIST methodologies to reduce EDT pattern counts and improve Logic BIST (LBIST) test coverage. VersaPoint test points can reduce compressed pattern counts 2X to 4X beyond compression alone and improve LBIST test coverage beyond what is p... » read more

Are Chips Getting More Reliable?
By Ed Sperling - 28 Jan, 2016 - Comments: 4

Reliability is emerging as a key metric in the semiconductor industry, alongside of power, performance and cost, but it also is becoming harder to measure and increasingly difficult to achieve. Most large semiconductor companies look at reliability in connection with consumer devices that last several years before they are replaced, but a big push into automotive, medical and industrial elec... » read more

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2024 SMG   |  Terms of Service  |  Privacy Policy