tag: MEMS

Manufacturing Bits: Dec. 23
By Mark LaPedus - 23 Dec, 2014 - Comments: 0

Higgs boson sensors At the recent 2014 IEEE International Electron Devices Meeting (IEDM) in San Francisco, CERN described the tiny hybrid pixel detectors used at the Large Hadron Collider (LHC). Using CMOS technology, hybrid pixel detectors identify and tag individual sub-atomic particles at fast speeds. CERN, the European Organization for Nuclear Research, is a particle physics laboratory... » read more

Industry Scorecard For 2014
By Brian Bailey - 18 Dec, 2014 - Comments: 0

At the end of last year, Semiconductor Engineering asked the industry about the developments they expected to see in 2014. If you care to refresh your memory, they were categorized under markets, semiconductors and development tools. Now it is time to look back and see how accurate those predictions were and where they fell short. Markets The obvious trend, at the beginning of the year, wa... » read more

How To Test IoT Devices
By Mark LaPedus - 11 Dec, 2014 - Comments: 0

At a recent event, test experts said the IC industry needs a new paradigm in testing chips for the [getkc id="76" comment="Internet of Things"] (IoT). The message was fairly simple to interpret. Existing automatic test equipment (ATE) is well suited to test today’s digital, analog, and mixed-signal chips, though it may be ill-equipped or too expensive to test IoT-based devices. But wha... » read more

Short-Range, Low-Power Sensors
By Ernest Worthman - 09 Dec, 2014 - Comments: 1

Over the last 10 years the world has done a remarkably good job of connecting the global wireless world. This is partly because of visionaries, partly because of marketers, and partly just because we can, but mostly because of convenience. We now never need be to be off the wide-area interconnected highway. The last decade has radically changed the way we live. The smartphone and its cousin, th... » read more

More Than Moore
By Ed Sperling - 15 Sep, 2014 - Comments: 0

Semiconductor Engineering sat down to discuss the value of feature shrinks and what comes next with Steve Eplett, design technology and automation manager at [getentity id="22664" e_name="Open-Silicon"]; Patrick Soheili, vice president and general manager of IP Solutions at [getentity id="22242" e_name="eSilicon"]; Brandon Wang, engineering group director at [getentity id="22032" e_name="Cadenc... » read more

What Comes Next?
By SEMI - 27 Jun, 2014 - Comments: 0

The latest manufacturing, materials and production developments for emerging and adjacent markets will be featured at SEMICON West 2014 (www.semiconwest.org), to be held on July 8-10 at the Moscone Center in San Francisco, Calif. The co-location of emerging and adjacent market focused exhibitors and technical presentations within the framework of SEMICON West maximizes the synergies between sem... » read more

What’s Next For MEMS
By SEMI - 15 May, 2014 - Comments: 0

By Paula Doe While MEMS sensors and actuators are key to enabling most of the high profile markets of tomorrow, from wearables to smart objects in the Internet of Things, MEMS companies face challenges today in transitioning to those new opportunities as basic MEMS devices increasingly becoming commodities. Large corporations are hiring their own in-house MEMS engineers, as standard platforms ... » read more

The Week In Review: Manufacturing
By Mark LaPedus - 09 May, 2014 - Comments: 0

Samsung Electronics announced that its memory fabrication line in Xi’an China has begun full-scale manufacturing operations. The new facility will manufacture Samsung’s advanced NAND flash memory chips, dubbed 3D V-NAND. A recent chemical leak at Intel’s fab in Arizona was contained and two workers were taken to a hospital for observation, according to reports. Apparently, Intel was i... » read more

The Wearables Wave Expands Today’s Mobile Experience
By Andrew Frame - 10 Apr, 2014 - Comments: 1

By Andrew Frame and Bee Hayes-Thakore There’s no question that the mobile experience is expanding. Today’s smartphones, all powerful computing devices, have made it possible for us to stay connected to the information that matters most to us, offering at-a-glance information in a compact, portable form for extended periods of time. Most of us are always within easy reach of our smartphones... » read more

Challenges In 3D Resists
By Katherine Derbyshire - 24 Mar, 2014 - Comments: 2

3D integration straddles the line between CMOS fabs and packaging and assembly houses. Depending on the structure being fabricated, the most appropriate process might be more “CMOS-like” or more “package-like.” For example, in CMOS fabs lithography means spin-on photoresist, exposed by a high precision stepper. Inherent in this approach is an assumption that the wafer surface is flat... » read more

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