What Exactly Is Multi-Physics?


Multi-physics is the new buzzword in semiconductor design and analysis, but the fuzziness of the term is a reflection of just how many new and existing problems need to be addressed simultaneously in the design flow with advanced nodes and packaging. This disaggregation of planar SoCs and the inclusion of more processing elements, memories, interconnects, and passives inside a package has cr... » read more

Optimizing DFT With AI And BiST


Experts at the Table: Semiconductor Engineering sat down to explore how AI impacts design for testability, with Jeorge Hurtarte, senior director of product marketing in the Semiconductor Test Group at Teradyne; Sri Ganta, director of test products at Synopsys; Dave Armstrong, principal test strategist at Advantest; and Lee Harrison, director of Tessent automotive IC solutions at Siemens EDA. Wh... » read more

Silent Data Errors Still Slipping Through The Cracks


Silent data corruption errors in large server farms have become a major concern of cloud users, hyperscalers, processor manufacturers and the test community. Silent data errors (also called silent data corruption errors) are hardware errors that occur when an incorrect computational result from a processor core goes undetected by the system. The data is silently corrupted because neither sof... » read more

Simulation Closes Gap Between Chip Design Optimization And Manufacturability


Simulation is playing an increasingly critical and central role throughout the design-through-manufacturing flow, fusing together everything from design to manufacturing and test in order to reduce the number and cost of silicon respins. The sheer density of modern chips, combined with advanced packaging techniques like 3D stacking and heterogeneous integration, has made iterative physical p... » read more

Enhancing Reliability For Automotive ICs


As an IC designer focused on automotive applications, reliability is likely one of your top priorities. The components you develop need to withstand extreme environmental conditions, maintain performance over extended lifetimes, and meet rigorous industry standards. Failure is simply not an option when it comes to automotive electronics. Achieving the required levels of reliability can be a ... » read more

Automotive Outlook 2025: Ecosystem Pivots Around SDV


The automotive industry is deep in the throes of a massive shift to software-defined vehicle architectures, a multi-year effort that will change the way automotive chips are designed, where they are used, and how they are sourced. Creating a new vehicle architecture is no small feat. OEMs need to figure out who to partner with and which aspects of their current architecture to include. This ... » read more

Med Tech Morphs Into Consumer Wearables


Doctors have been using advanced technology for years, but the growing trend is for consumers to use devices at home and have direct access to their data. Watches and rings that were once primarily used for counting steps or registering sleep patterns can now read blood pressure, heart rate, blood oxygen, body temperature, and other early signs of illness. Meanwhile, various patches are under d... » read more

Automotive Security Shifts To The System Level


Cars are getting smarter, more complicated, and more vulnerable to cyberattacks. As the amount of semiconductor and software content continues to increase, so does the number of over-the-air updates and connections to edge-based servers and services, adding a variety of new vectors for attacks. Properly securing vehicles requires engineers to first identify all the possible connection points... » read more

Beyond Simulation: Transforming Early IC Design With Insight Analyzer


Traditional verification methods are proving inadequate for addressing critical reliability challenges in today's increasingly complex integrated circuit (IC) designs. Modern IC design requires a proactive approach to verification that emphasizes early-stage analysis. The shift-left methodology enables earlier identification of potential design risks, addressing the complex challenges of IP blo... » read more

Blog Review: Feb. 5


Cadence's Rajneesh Chauhan explores the extended metadata feature in CXL 3.1, which helps systems manage memory and devices more effectively by sending extra information along with memory transactions to provide more context about what's happening during these transactions. Siemens' Bianca Ward recommends semiconductor companies combat rising production costs by leaning into digitalization a... » read more

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