tag: multi-die

Preparing For The Multiphysics Future of 3D ICs
By Siemens EDA - 01 Apr, 2026 - Comments: 0

3D integrated circuits (3D ICs) are emerging as a revolutionary approach to design, manufacturing and packaging in the semiconductor industry. Offering significant advantages in size, performance, power efficiency and cost, 3D ICs are poised to transform the landscape of electronic devices. However, with 3D ICs come new design and verification challenges that must be addressed to ensure success... » read more

IP Requirements Evolve For 3D Multi-Die Designs
By Madhumita Sanyal - 26 Mar, 2026 - Comments: 0

As Moore’s Law continues to slow and demand for compute density and bandwidth accelerates, the semiconductor industry is rapidly shifting from monolithic SoCs to 3D multi-die designs. While 2.5D integration has extended system scaling, it is no longer sufficient to meet the bandwidth, latency, and power requirements of AI, HPC, and advanced automotive applications. The move to true 3D multi-d... » read more

Enabling Seamless Monitoring, Test, And Repair In Multi-Die Designs
By Yervant Zorian - 10 Mar, 2026 - Comments: 0

By Yervant Zorian and Sandeep Kumar Goel Anyone who follows the semiconductor industry knows that the accelerating performance, scale and energy efficiency demands of the AI revolution are outpacing the advances achievable by simply pushing the chip performance of monolithic, single-die designs. Multi-die design using 2.5D and 3D technologies has emerged as a necessity to keep the pace of in... » read more

The Future of Semiconductors: Engineering in the Convergence era
By Siemens EDA - 09 Mar, 2026 - Comments: 0

The semiconductor industry is entering a convergence era where silicon, software, physics, packaging, security, AI, and power constraints all intertwine. Device scaling still matters but architecture, integration, verification, and automation will define the industry’s trajectory. Organizations that embrace this cross-domain, lifecycle-oriented mindset will define the next decade. Moore’... » read more

How IP Subsystems For Chiplets Will Unlock Your Next Wave Of Innovation
By Robert Kruger - 26 Feb, 2026 - Comments: 0

After many years of hope, promises, and commercial challenges, a robust environment that supports multi-die design is now taking shape. These events represent a sea of change for semiconductor design and manufacturing when compared to the traditional single-die monolithic design approach. Moore’s Law drove these original and substantial monolithic design accomplishments. But the massive requi... » read more

Monitor, Test, And Repair For Multi-Die Health And Reliability
By Yervant Zorian - 09 Sep, 2025 - Comments: 0

Ever since the earliest semiconductor devices, silicon health has been a concern. Systems manufacturers wanted to be sure that their chips worked properly before being soldered onto printed circuit boards (PCBs). They put pressure on semiconductor suppliers to test wafers, individual dies, and assembled parts before they were shipped. A wide range of design-for-test (DFT) approaches were develo... » read more

A Smarter Path To Chiplets Through An Enhanced Multi-Die Solution
By Andy Nightingale - 28 Aug, 2025 - Comments: 0

The rise of artificial intelligence (AI) is advancing at breakneck speed, pushing computing demands. At the same time, Moore’s Law slows, making monolithic devices increasingly cost-prohibitive and harder to scale. As traditional monolithic scaling hits the wall, the solution is to disaggregate the design into multiple dies, known as chiplets. These chiplets are mounted on a common substrate ... » read more

Digital Engineering Transforms Chips For The Future
By Jayraj Nair - 14 Aug, 2025 - Comments: 0

The semiconductor industry stands at a critical turning point. With global semiconductor sales exceeding $600 billion last year, the need for the industry to scale has never been more apparent. As AI applications drive unprecedented requirements for processing capabilities, chip designers are turning to advanced simulation technologies to enable the digital engineering workflows that will sup... » read more

Streamlining Functional Verification For Multi-Die And Chiplet Designs
By Cadence - 30 Jul, 2025 - Comments: 0

An Opportunity and a Challenge The manufacturing aspects of multi-die/multi-chiplet designs are often highlighted, but what about verification? Functional correctness and performance of inter-die connections via a standard interface, such as UCIe or a custom inter-die interface, are not guaranteed to meet all system requirements. These interfaces must be verified comprehensively, ensuring co... » read more

AI Pushes High-End Mobile From SoCs To Multi-Die
By Liz Allan - 08 Jul, 2025 - Comments: 0

Advanced packaging is becoming a key differentiator for the high end of the mobile phone market, enabling higher performance, more flexibility, and faster time to market than systems on chip. Monolithic SoCs likely will remain the technology of choice for low-end and midrange mobile devices because of their form factor, proven record, and lower cost. But multi-die assemblies provide more fle... » read more

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