tag: National Instruments

Auto Chip Test Issues Grow
By Jeff Dorsch - 08 Jan, 2018 - Comments: 0

By Jeff Dorsch & Ed Sperling Semiconductor suppliers are flocking to the automotive chip market to gain share in fitting out the connected car and the autonomous vehicle. But before those chips are sold to automotive manufacturers and Tier 1 suppliers, they must be tested and certified to meet stringent industry standards. This is no ordinary testing, though. Assisted and autonomous v... » read more

Grounding Considerations For Improved Measurements
By NI - 08 Jan, 2018 - Comments: 0

Learn how grounding can determine how a measurement system should be connected for the most accurate measurements. Article topics include grounded signal sources, floating signal sources, differential measurements, single-ended measurements, and the proper signal and measurement configuration. This tutorial is part of the Instrument Fundamentals series. To read more, click here. » read more

How To Deal With The Flood Of Analog Data
By Daniel Parrott - 08 Jan, 2018 - Comments: 0

Analog data from a variety of sensors and other devices is a huge problem. Here are three approaches to overcoming the problems that big analog data can cause. Approach 1: Analyze at the Edge A lot of data can be collected at the point of capture, but most of it’s uninteresting. You can save and analyze it all or you can take advantage of intelligent embedded software that constantly meas... » read more

Blog Review: Dec. 20
By Jesse Allen - 20 Dec, 2017 - Comments: 0

Mentor's Andrew Macleod points out five things that need to happen for autonomous and electric cars to move from R&D and test cases to mass-produced, commercially viable vehicles. Synopsys' Iain Singleton provides some tips on tackling large designs with formal and how the assume-guarantee technique helps split them without masking bugs. Cadence's Paul McLellan shares updates from the... » read more

Get Ready For 5G
By Mike Rosa - 18 Dec, 2017 - Comments: 0

The 5G wireless rollout, expected to occur over the next few years, will have a major impact on both the number and types of ICs in end-user devices, and on the base stations and repeaters needed to transmit the higher frequency signals. The 5G standard is expected to deliver 10 Gbps of bandwidth— up to 10X the data rates achievable using the advanced forms of 4G— and sub-5ms latencies. ... » read more

The Week In Review: Manufacturing
By Mark LaPedus - 15 Dec, 2017 - Comments: 0

Chipmakers Apple has announced the latest award from its $1 billion Advanced Manufacturing Fund. Finisar, a manufacturer of optical communications components, will receive $390 million in funds from Apple. The award will enable Finisar to increase its R&D spending and high-volume production of vertical-cavity surface-emitting lasers (VCSELs). A VCSEL is a type of semiconductor laser diode. The... » read more

Blog Review: Dec. 13
By Jesse Allen - 13 Dec, 2017 - Comments: 0

Mentor's Sherif Hany notes that pattern matching isn't just for litho hotspots anymore, and is increasingly being used in a wide range of early design phase checks, DRC flows, layout retargeting and fixing and DFM checks. Synopsys' Eric Huang explains why USB cables have gotten so short, even though no length is mentioned in the specification. Cadence's Paul McLellan listens in as Jeremy ... » read more

Changes Ahead For Test
By Jeff Dorsch - 11 Dec, 2017 - Comments: 0

Testing microprocessors is becoming more difficult and more time consuming as these devices are designed to take on more complex tasks, such as accelerating artificial intelligence computing, enabling automated driving, and supporting deep neural networks. This is not just limited to microprocessors, either. Graphics processing units are grabbing market share in supercomputing and other area... » read more

Securing Your Test System
By NI - 11 Dec, 2017 - Comments: 0

Test systems, like other industrial equipment, are vulnerable to cyber attacks. That requires a phased approach to cyber security, addressing the most likely threats first and communicating with suppliers to understand threats upstream in the supply chain. To read more, click here. » read more

The Week In Review: Manufacturing
By Mark LaPedus - 08 Dec, 2017 - Comments: 0

Fab tools and test Four former employees at Applied Materials were charged by the U.S. for allegedly trying to steal the company’s own fab tool technology designs, according to a report from Bloomberg and others. The former employees were allegedly trying to sell the technology to a Chinese startup that would compete against Applied, according to the report. The former employees--Liang C... » read more

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