tag: NI

Delivering On Power During HPC Test
By Anne Meixner - 09 Jul, 2024 - Comments: 0

The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the power delivery network (PDN). In response, ATE, wafer probe, and contactor vendors are introducing some innovative approaches and test procedures that can ensure robust power delivery to ATE pro... » read more

Testing PAs under Digital Predistortion and Dynamic Power Supply Conditions
By NI - 09 Jul, 2024 - Comments: 0

The power amplifier (PA) – as either a discrete component or part of an integrated front end module (FEM) – is one of the most integral RF integrated circuits (RFICs) in the modern radio. In this application note, you will learn different techniques for testing PAs through an interactive application note with multiple how-to videos. To address these linearity and efficiency requirements,... » read more

Unlocking Efficiency: Tackling The Hidden Costs Of Setting Up Test
By Juan Valdivia - 11 Jun, 2024 - Comments: 0

In the rapidly evolving landscape of technology and manufacturing, the efficiency and effectiveness of automated test systems can significantly impact a company's bottom line. Have you considered where the bulk of these costs come from? While the complexities involved in developing, deploying, and maintaining these systems often pose substantial challenges, they also present immense opportuniti... » read more

Power-Aware Revolution In Automated Test For ICs
By Gregory Haley - 11 Jun, 2024 - Comments: 0

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and the overall functionality of a chip. Unlike traditional ATPG, which generates test patterns solely to ensure device functionality, power-aware ATPG takes it a step further by meticulously consider... » read more

Fundamentals of Power Amplifier Testing
By NI - 11 Jun, 2024 - Comments: 0

The power amplifier (PA) – as either a discrete component or part of an integrated front end module (FEM) – is one of the most integral RF integrated circuits (RFICs) in the modern radio. In this application note, you will learn the basics of testing RF PAs and FEMs through an interactive application note with multiple how-to videos. When characterizing the performance of an RF PA, engin... » read more

Reducing Risk In The Semiconductor Supply Chain
By Laura Peters - 23 May, 2024 - Comments: 0

Companies that were hit with chip shortages during the pandemic are changing their strategies to prevent future problems, deploying a combination of supply chain mapping, second sourcing, and digital transformation. Those shortages caused a $200 billion loss for automotive manufacturers, and the disruptions were far more widespread, in many cases lasting for years. Companies of all sorts wer... » read more

Advancing Product Performance Through Adaptable Production Test Equipment
By Michael Bryner - 14 May, 2024 - Comments: 0

Semiconductors are the backbone of modern electronics, powering everything from smartphones and laptops to autonomous vehicles and advanced medical equipment. As the semiconductor industry continues to push technological boundaries to deliver faster, smaller, and more powerful devices, ensuring the reliability and optimal performance of these components becomes increasingly challenging. A modu... » read more

Can Models Created With AI Be Trusted?
By Brian Bailey - 06 May, 2024 - Comments: 0

EDA models that are created using AI need to pass more stringent quality and cost benefit analysis compared to many AI applications in the broader industry. Money is hanging on the line if AI gets it wrong, and all the associated costs must be factored into the equation. Models are some of the most expensive things a development team can create, and it is important to understand the value th... » read more

IC Test And Quality Requirements Drive New Collaboration
By Laura Peters - 09 Apr, 2024 - Comments: 0

Rapidly increasing chip and package complexity, coupled with an incessant demand for more reliability, has triggered a frenzy of alliances and working relationships that are starting to redefine how chips are tested and monitored. At the core of this shift is a growing recognition that no company can do everything, and that to work together will require much tighter integration of flows, met... » read more

The Need For Speed: Wi-Fi 7 And The Era Of Ultra-Fast Internet
By Alejandro Escobar Calderon - 09 Apr, 2024 - Comments: 0

The exponential growth of data consumption and the proliferation of connected devices have driven the need for the development of Wi-Fi 7. With the increasing demand for high-speed internet access, especially in bandwidth-intensive applications such as streaming, gaming, and virtual reality, existing wireless standards have become inadequate to meet the evolving needs of users. Wi-Fi 7 addresse... » read more

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