tag: noise

Always-On, Ultra-Low-Power Design Gains Traction
By Ann Mutschler - 14 Apr, 2022 - Comments: 0

A surge of electronic devices powered by batteries, combined with ever-increasing demand for more features, intelligence, and performance, is putting a premium on chip designs that require much lower power. This is especially true for always-on circuits, which are being added into AR/VR, automotive applications with over-the-air updates, security cameras, drones, and robotics. Also known as ... » read more

The Value Of RF Harmonic Balance Analyses For Analog Verification
By Pradeep Thiagarajan - 24 Mar, 2022 - Comments: 0

By Pradeep Thiagarajan and Scott Guyton The world we live in is intricately connected by electronic systems that are expected to function flawlessly to satisfy consumer needs. Functionality violations beyond certain tolerance levels are frowned upon and negatively impact the quality level of products. These systems are required to function accurately, in tandem with other interdependent syst... » read more

Enabling Training of Neural Networks on Noisy Hardware
By Technical Paper Link - 18 Nov, 2021 - Comments: 0

Abstract:  "Deep neural networks (DNNs) are typically trained using the conventional stochastic gradient descent (SGD) algorithm. However, SGD performs poorly when applied to train networks on non-ideal analog hardware composed of resistive device arrays with non-symmetric conductance modulation characteristics. Recently we proposed a new algorithm, the Tiki-Taka algorithm, that overcomes t... » read more

Wrestling With Analog At 3nm
By Brian Bailey - 09 Sep, 2021 - Comments: 0

Analog engineers are facing big challenges at 3nm, forcing them to come up with creative solutions to a widening set of issues at each new process node. Still, these problems must be addressed, because no digital chip will work without at least some analog circuitry. As fabrication technologies shrink, digital logic improves in some combination of power, performance, and area. The process te... » read more

Using 5nm Chips And Advanced Packages In Cars
By Ed Sperling - 10 Mar, 2021 - Comments: 1

Semiconductor Engineering sat down to discuss the impact of advanced node chips and advanced packaging on automotive reliability with Jay Rathert, senior director of strategic collaborations at KLA; Dennis Ciplickas, vice president of advanced solutions at PDF Solutions; Uzi Baruch, vice president and general manager of the automotive business unit at OptimalPlus; Gal Carmel, general manager of... » read more

Power/Performance Bits: Jan. 5
By Jesse Allen - 05 Jan, 2021 - Comments: 0

Quiet qubits Researchers at the University of New South Wales Sydney recorded the lowest noise levels yet for a semiconductor qubit. Charge noise caused by material imperfections interferes with the information encoded on qubits, reducing accuracy. "The level of charge noise in semiconductor qubits has been a critical obstacle to achieving the accuracy levels we need for large-scale error-c... » read more

How Will Future Cars Interact With Humans?
By Bryon Moyer - 03 Dec, 2020 - Comments: 0

Future automobiles may come with a set of controls very different from what we’re used to now. Mechanical knobs and switches already are being replaced by touchscreens, but that's just the beginning. There are a multitude of other possible ways in which drivers can interact with their vehicles, and the list is growing as technology drives down the cost of this new human-machine interface (... » read more

High Throughput Noise Measurements
By Peter Andrews - 10 Nov, 2020 - Comments: 0

Flicker noise and random telegraph noise (RTN) testing can take a long time, especially when measuring down to frequencies of 1 Hz or below. Sweep times up to 30 min at a single temperature are common. And standard data collection for device models requires DUT data at multiple temperatures on small pads. To lower Cost of Test (CoT), and significantly increase on-wafer test throughput, a... » read more

112G SerDes Reliability
By Ed Sperling - 05 Oct, 2020 - Comments: 0

Priyank Shukla, product marketing manager at Synopsys, digs into 112Gbps SerDes, why it’s important to examine the performance of these devices in the context of a system, what is acceptable channel loss, and how density can affect performance, power and noise. » read more

Integrity Problems For Edge Devices
By Brian Bailey - 14 Sep, 2020 - Comments: 0

Battery-powered edge devices need to save every picojoule of energy they can, which often means running at very low voltages. This can create signal and power integrity issues normally seen at the very latest technology nodes. But because these tend to be lower-volume, lower-cost devices, developers often cannot afford to perform the same level of analysis on these devices. Noise can come in... » read more

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